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How To Prepare Designs for 65 nm MirrorBit® GL and
65 nm MirrorBit® EclipseTM GL Product Families
Application Note
By: Doug Kearns
1. Introduction
Spansion continues to extend the MirrorBit® GL family of 3V NOR Flash with two additional GL families based
on 65 nm MirrorBit technology. The S29GL-R family is a close copy of the existing 90 nm S29GL-P family and
the S29GL-S family will incorporate the MirrorBit® EclipseTM architecture to the GL Flash portfolio. Spansion
has developed these families with migration in mind and customers can prepare current projects in
development to allow use of these additional families. This document will outline the product differences that
will require attention to facilitate migration to these additional GL family products.
2. GL Family Feature Comparison
Table 2.1 provides an overview of the differences between the various high density MirrorBit GL families. The
65 nm MirrorBit Eclipse GL family will bring improved program and erase performance to high density
MirrorBit NOR applications while maintaining basic hardware and software compatibility to allow use on
existing designs. The feature differences will be discussed individually in Section 3.
One underlying difference between the current MirrorBit GL and future 65 nm products is the use of an
internal micro controller to manage flash activities instead of a hard-wired state machine. The benefit of this
approach is improved performance and feature additions. The trade off with this approach is an increase in
the time required for the device to self-configure when power is applied. The differences in Power On Reset
timing will be discussed in detail in Section 4. The differences in AC & DC specifications are detailed in
Section 5.
Table 2.1 GL Family Feature Comparison (Sheet 1 of 2)
Family
S29GL-N
S29GL-P
S29GL-R
S29GL-S
Process Node
110 nm
90 nm
65 nm
65 nm
Introduction
2005
2007
2009
2010
Density
128 Mbit
√
√
√
256 Mbit
√
√
√
512 Mbit
√
√
√
1024 Mbit
√
√
2048 Mbit
√ (multi-die)
√
√
√ (multi-die)
Sector Size
128KB
√
√
√
√
Data Size
Bus Width
x8/x16
x8/x16
x8/x16
x16
Read Page
16 Byte
16 Byte
16 Byte
32 Byte
Write Buffer
32 Byte
64 Byte
64 Byte
512 Byte
Packaging
56-TSOP
√
√
√
√
64-BGA
√
√
√
√
Asynchronous
√
√
√
√
OTP Area
256 Byte
256 Byte
512 Byte
1024 Byte
Other
Publication Number Designs_for_GL_Products_AN
Revision 04
Issue Date April 14, 2010
A pplication
Note
Table 2.1 GL Family Feature Comparison (Sheet 2 of 2)
Family
S29GL-N
S29GL-P
S29GL-R
S29GL-S
Write Protect
√
√
√
√
√
√
√
√
√
√
√ (1)
√
Read Protect
Unlock Bypass
√
√
Multi-Sector Erase
√
√
Data Polling
√
√
Status Register
Accelerated Programming
√
√
Multi-pass Programming
√
√
Note:
1. S29GL-N, S29GL-P and S29GL-S families support unlimited multi-pass programming utilizing either write buffer or single word write
commands. S29GL-R does not support multi-pass programming (see Single Word and Multi-pass Write Buffer Programming
on page 13).
3. Feature Difference Discussion
3.1
Density
The S29GL-R family is available in monolithic 512 and 1024 Mbit densities only.
The S29GL-S family is available in monolithic 128, 256, 512 and 1024 Mbit densities. The 2048 Mbit density
is a same-die-stack package consisting of two 1024 Mbit die whose access is controlled by address input
A27.
Customers currently using the S29GL128P and S29GL256P should prepare for migration to the S29GL-S
equivalent density device.
3.2
Sector Size
The S29GL-R and S29GL-S families have 128 KB uniform sectors, consistent with the S29GL-N and
S29GL-P.
3.3
Data Size
The S29GL-R has x8/x16 selectable data bus width, consistent with the S29GL-N and S29GL-P. When the
BYTE# input is pulled high, the device will operate with a 16-bit wide data bus. When BYTE# is pulled low, the
device will operate with an 8-bit data bus. If the device is always used in Byte mode, it is recommended to pull
the unused data bus I/O (DQ[15:8]) to high or low via a resistor on the PCB, to minimize noise injection and
power consumption on the unused inputs.
The S29GL-S only supports x16 data bus width. The BYTE# input on previous generations of MirrorBit GL
devices (pin 53 on 56-TSOP and pad F7 on 64-BGA) will be reserved for future use on the S29GL-S. The
BYTE# input on existing designs should be pulled high to force operation in x16 data mode to enable
migration to the S29GL-S.
3.4
Read Page Size
The S29GL-R has a 16-byte (8 word) read page buffer, consistent with the S29GL-N and S29GL-P.
The S29GL-S has a 32-byte (16 word) read page buffer, which is double the depth of the S29GL-N and
S29GL-P to facilitate larger processor cache line fill operations. No software modifications are required to
operate with 16-byte maximum page transfers supported by the S29GL-N and S29GL-P.
Software can be modified to take advantage of the deeper read page buffer on the S29GL-S by querying the
CFI programming buffer depth register at address 4Ch (x16 address bus reference) and configuring software
to perform additional page read cycles.
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3.5
No t e
Write Buffer Size
The S29GL-R has a 64-byte (32 word) write buffer, the same depth as the S29GL-P and double the depth of
the S29GL-N. No software modifications are required to operate with up to a 32-byte maximum write buffer fill
supported by the S29GL-N family.
The S29GL-S has a 512-byte (256 word) write buffer, eight times the depth of the existing S29GL-P and
sixteen times the depth of the existing S29GL-N. No software modifications are required to continue use of a
64-byte or 32-byte write buffer fill supported by the S29GL-N and S29GL-P.
Software can be modified to take advantage of the deeper write buffers by querying the CFI programming
buffer depth register at address 2Ah (x16 address bus reference) and configuring software to perform larger
buffer fills.
3.6
Device ID
The 512 Mbit and 1024 Mbit S29GL-R devices will have the same Device ID register values as the monolithic
density versions of the S29GL-N and S29GL-P families. Table 3.1 contains the Device ID values for the GL
families.
The 128 Mbit, 256 Mbit, 512 Mbit and 1024 Mbit S29GL-S devices will have the same Device ID register
values as the monolithic density versions of the S29GL-N and S29GL-P families. Table 3.1 contains the
Device ID values for the GL families.
Existing software that utilizes Device ID to set up software command support does not require modification to
enable basic functionality of the new MirrorBit GL and MirrorBit Eclipse GL families. Use of specific CFI
register reads should be employed to take advantage of new superset features such as wider read page
buffers and write buffers. CFI Process register bits at address 45h (x16 address bus reference) provide insystem determination of the unique GL family (e.g. GL-N: 0010h, GL-P: 0014h, GL-R: 0018h, GL-S: 001Bh).
Table 3.2 provides details of the CFI register values for each GL family. Device ID can only be accessed via
software Autoselect commands on the S29GL-R and S29GL-S not the optional high voltage method
supported on the S29GL-N and S29GL-P.
Table 3.1 Device IDs
Device ID (1)
Density
S29GL-N
S29/GL-P
S29GL-R
S29GL-S
128 Mb
7Eh / 21h / 01h
7Eh / 21h / 01h
7Eh / 21h / 01h
256 Mbit
7Eh / 22h / 01h
7Eh / 22h / 01h
7Eh / 22h / 01h
512 Mbit
7Eh / 23h / 01h
1 Gbit
7Eh / 23h / 01h
7Eh / 23h / 01h
7Eh / 23h / 01h
7Eh / 28h / 01h
7Eh / 28h / 01h
7Eh / 28h / 01h
2 Gbit
7Eh / 48h / 01h
Note:
In x16 mode, DQ[15:8] = 22h for standard S29GL devices.
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A pplication
Note
Table 3.2 CFI Registers (Sheet 1 of 2)
CFI Register
x16 Address
S29GL-N
S29GL-P
S29GL-R
S29GL-S (1)
“QRY” query unique
ASCII string
10h
11h
12h
0051h
0052h
0059h
0051h
0052h
0059h
0051h
0052h
0059h
0051h
0052h
0059h
Primary OEM
Command Set
13h
14h
0002h
0000h
0002h
0000h
0002h
0000h
0002h
0000h
Address for Primary
Extended Table
15h
16h
0040h
0000h
0040h
0000h
0040h
0000h
0040h
0000h
Alternate OEM
Command Set
17h
18h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
Address for Alternate
OEM Extended Table
19h
1Ah
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
VCC Min, Max
1Bh
1Ch
0027h
0036h
0027h
0036h
0027h (2)
0036h
0027h
0036h
VPP Min, Max
1Dh
1Eh
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
Typical timeout per
single write
1Fh
0007h
0006h
0000h
0008h
Typical timeout per
buffer write
20h
0007h
0009h
0009h
0009h
Typical timeout per
block erase
21h
000Ah
0009h
0009h
0008h
0012h (1 Gb),
0011h (512 Mb),
0010h (256 Mb),
000Fh (128 Mb)
Typical timeout for full
chip erase
22h
0000h
0013h
0013h = 1 Gb
0012h = 512 Mb
Max timeout per
single write
23h
0003h
0000h
0003h
0002h
Max timeout per
buffer write
24h
0005h
0005h
0005h
0002h
Max timeout per block
erase
25h
0004h
0003h
0003h
0003h
Max timeout for full
chip erase
26h
0000h
0002h
0002h
0003h
Device size = 2^N
27h
001Ah (512 Mb),
0019h (256 Mb),
0018h (128 Mb)
001Bh (1 Gb),
001Ah (512 Mb),
0019h (256 Mb),
0018h (128 Mb)
001Bh (1 Gb),
001Ah (512 Mb)
001Bh (1 Gb),
001Ah (512 Mb),
0019h (256 Mb),
0018h (128 Mb)
Flash Device
Interface description
28h
29h
0002h
0000h
0002h
0000h
0002h
0000h
0001h
0000h
Max Buffer Write Size
= 2^N
2Ah
2Bh
0005h
0000h
0006h
0000h
0006h
0000h
0009h
0000h
Number of Erase
Block Regions
2Ch
0001h
0001h
0001h
0001h
Erase Block Region 1
Info (1)
2Dh
00FFh (512 Mb),
00FFh (256 Mb),
007Fh (128 Mb)
00FFh (1 Gb),
00FFh (512 Mb),
00FFh (256 Mb),
007Fh (128 Mb)
00FFh (1 Gb),
00FFh (512 Mb)
00FFh (1 Gb),
00FFh (512 Mb),
00FFh (256 Mb),
007Fh (128 Mb)
2Eh
0001h (512 Mb),
0000h (256 Mb),
0000h (128 Mb)
0003h (1 Gb),
0001h (512 Mb),
0000h (256 Mb),
0000h (128 Mb)
0003h (1 Gb),
0001h (512 Mb)
0003h (1 Gb),
0001h (512 Mb),
0000h (256 Mb),
0000h (128 Mb)
Erase Block Region 1
Info (2)
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Table 3.2 CFI Registers (Sheet 2 of 2)
CFI Register
x16 Address
S29GL-N
S29GL-P
S29GL-R
S29GL-S (1)
0000h (1 Gb),
0000h (512 Mb)
0000h (1 Gb),
0000h (512 Mb),
0000h (256 Mb),
0000h (128 Mb)
Erase Block Region 1
Info (3)
2Fh
0000h (512 Mb),
0000h (256 Mb),
0000h (128 Mb)
0000h (1 Gb),
0000h (512 Mb),
0000h (256 Mb),
0000h (128 Mb)
Erase Block Region 1
Info (4)
30h
0002h (512 Mb),
0002h (256 Mb),
0002h (128 Mb)
0002h (1 Gb),
0002h (512 Mb),
0002h (256 Mb),
0002h (128 Mb)
0002h (1 Gb),
0002h (512 Mb)
0002h (1 Gb),
0002h (512 Mb),
0002h (256 Mb),
0002h (128 Mb)
Erase Block Region 2
Info
31h
32h
33h
34h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
Erase Block Region 3
Info
35h
36h
37h
38h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
Erase Block Region 4
Info
39h
3Ah
3Bh
3Ch
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
“PRI” query unique
ASCII string
40h
41h
42h
0050h
0052h
0049h
0050h
0052h
0049h
0050h
0052h
0049h
0050h
0052h
0049h
Major version number
43h
0031h
0031h
0031h
0031h
Minor version number
44h
0033h
0033h
0033h
0034h
Address Unlock /
Process bits
45h
0010h
0014h
0020h
001Ch
Erase Suspend
46h
0002h
0002h
0002h
0002h
Sector Protect
47h
0001h
0001h
0001h
0001h
Sector Temporary
Unprotect
48h
0000h
0000h
0000h
0000h
Sector Protection
Scheme
49h
0008h
0008h
0008h
0008h
Simul-Op
4Ah
0000h
0000h
0000h
0000h
Burst Mode
4Bh
0000h
0000h
0000h
0000h
Page Mode Type
4Ch
0002h
0002h
0002h
0003h
ACC Supply Min
4Dh
00B5h
00B5h
0000h
0000h
ACC Supply Max
4Eh
00C5h
00C5h
0000h
0000h
WP# Protection
4Fh
0004h (Bottom)
0005h (Top)
0004h (Bottom)
0005h (Top)
0004h (Bottom)
0005h (Top)
0004h (Bottom)
0005h (Top)
Program Suspend
50h
0001h
0001h
0001h
0001h
Unlock Bypass
51h
N/A
N/A
N/A
0000h
Note:
1. For same-die-stacked 2 Gbit GL-S, returned CFI values will be those of the 1 Gbit die in the lower half of the 2 Gbit device address space.
2. For GL-R regulated voltage models, VCC Min CFI register value at offset 1Bh is 0030h.
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A pplication
3.7
Note
Packaging
The S29GL-R is available in 56-TSOP and 64-BGA and has asynchronous operation signal pin out consistent
with the S29GL-N and S29GL-P. The outer dimensions of the 64-ball BGA packaged will be reduced to 9 x 9
mm from 11 x 13 mm which will mandate changes to the surface mount placement program but not to the
printed circuit board layout.
The S29GL-S is available in 56-TSOP and 64-BGA and has asynchronous operation signal pin out consistent
with the S29GL-N and S29GL-P (see Notes attached to Figures 3.1 and 3.2 for specific pin connection
requirements). The 128, 256, 512, and 1024 Mbit density S29GL-S devices use the LAA064 and LAE064
package, which has outer dimensions of 9 x 9 mm, smaller than the 11 x 13 mm outer dimensions of the
LAA064 package used by the S29GL-N and S29GL-P devices. Use of the smaller LAE064 package requires
modification to the surface mount placement program but not to the printed circuit board layout. The samedie-stacked 2 Gbit density uses the 11 x 13 mm LAA064 package, consistent with the S29GL-P and
S70GL02GP.
Figure 3.1 GL 64-ball Fortified BGA Signal Land Pattern
Notes:
1. Pads A1, A8, H1 & H8 are Not Connected (internally) and should be left floating.
2. Pads D1, E1 & G1 are Reserved for Future Use and should be left floating.
3. For GL-S, pad F7 is Reserved for Future Use and should be pulled high.
4. For GL-S, pad G7 is DQ15 (only).
5. All active address inputs for a given density device must be controlled, e.g. A[25:0] for x16 S29GL512S. Unused higher order address
inputs can be controlled or left floating. Unused data I/O should be pulled low.
6. For GL-R and GL-S, pad B4 is WP# (only).
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Figure 3.2 GL 56-TSOP Signal Pin Out
Notes:
1. Pins -28 & -30 are Reserved for Future Use and should be left floating.
2. For GL-S, pin -51 is DQ15 (only).
3. For GL-S, pin -53 is Reserved for Future Use and should be pulled high.
4. All active address inputs for a given density device must be controlled, e.g. A[25:0] for x16 S29GL512S. Unused higher order address
inputs can be controlled or left floating. Unused data I/O should be pulled low.
5. For GL-R and GL-S, pin 16 is WP# (only).
3.8
Asynchronous Mode
The S29GL-R supports asynchronous single and page read modes, consistent with the S29GL-N and
S29GL-P.
The S29GL-S supports asynchronous single and page read modes, consistent with the S29GL-N and
S29GL-P. Software can be modified to take advantage of the wider read page buffer on the S29GL-S by
querying the CFI programming buffer depth register at address 98h (x8 address bus reference) or 4Ch (x16
address bus reference) and configuring software to perform additional page read cycles.
3.9
OTP Area
The S29GL-R supports two 256 byte one time programmable Secure Silicon areas, double the available OTP
space on the S29GL-N and S29GL-P.
The S29GL-S supports two 512 byte one time programmable Secure Silicon areas, quadruple the available
OTP space on the S29GL-N and S29GL-P.
3.10
Write Protection
The S29GL-R supports Advanced Sector Protection (ASP) program and erase protection via single voltage,
password, non-volatile and volatile control, consistent with the S29GL-N and S29GL-P.
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A pplication
Note
The S29GL-S supports Advanced Sector Protection (ASP) program and erase protection via single voltage,
password, non-volatile and volatile control, consistent with the S29GL-N and S29GL-P.
Details of ASP program and erase protection implementations can be found in the S29GL-P, S29GL-R and
S29GL-S data sheets.
3.11
Read Protection
The S29GL-R supports Advanced Sector Protection (ASP) read protection via a customer specific ordering
option. The S29GL-N and S29GL-P did not support read protection.
The S29GL-S supports Advanced Sector Protection (ASP) read protection via a customer specific ordering
option. The S29GL-N and S29GL-P did not support read protection.
Details of ASP read protection implementation can be found in the S29GL-R and S29GL-S data sheets.
3.12
Unlock Bypass
The S29GL-R does not support Unlock Bypass mode programming, unlike the S29GL-N and S29GL-P.
The S29GL-S does not support Unlock Bypass mode programming, unlike the S29GL-N and S29GL-P.
Unlock Bypass mode programming is a legacy feature used to decrease the command overhead by 50%
when performing single byte or word programming using the Single byte or word programming command.
Applications using high density GL devices rely on multi-word write buffer programming to maximize
programming throughput. Write buffer programming supports single byte/word programming and has
inherently low effective command overhead. Unlock Bypass mode programming is rarely used in GL Flash
applications. Those applications that do support Unlock Bypass programming will require modification to use
standard single byte/word programming or write buffer programming commands.
3.13
Multi-sector Erase
The S29GL-R does not support multi-sector erase, unlike the S29GL-N and S29GL-P.
The S29GL-S does not support multi-sector erase, unlike the S29GL-N and S29GL-P.
Multi-sector erase is a legacy feature that allowed queueing of multiple sector erase operations within one
command string to minimize command overhead. This is a rarely used function. Those applications that do
support multi-sector erase will require modification to limit sector erase operations to individual sectors only.
3.14
Data Polling
The S29GL-R supports data polling to determine the status of embedded programming and erase operations;
however, unlike the S29GL-N and S29GL-P, it does not support the legacy DQ3 erase time out indicator
function. Applications that utilize DQ3 data polling to validate multi-sector erase command acceptance will
require modification.
The S29GL-S supports data polling to determine the status of embedded programming and erase operations;
however, unlike the S29GL-N and S29GL-P, it does not support the legacy DQ3 erase time out indicator
function. Applications that utilize DQ3 data polling to validate multi-sector erase command acceptance will
require modification. Additionally, DQ0 now provides an indication to system software when a Write-ToBuffer-Abort-Reset command can be issued. This command can only be accepted when DQ0 is high
following an incorrect write buffer load sequence or when status register bit DQ7 is high indicating no
embedded algorithms are active. System software may require modification to accommodate this change.
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3.15
No t e
Status Register
The S29GL-R supports Status Register reads to determine embedded program and erase operation status,
in addition to data polling use on the S29GL-N and S29GL-P.
The S29GL-S supports Status Register reads to determine embedded program and erase operation status, in
addition to data polling use on the S29GL-N and S29GL-P.
The status of program and erase operations is provided by a single 16-bit status register. The Status Register
Read command is written followed by one read access of the status register information. The contents of the
status register overlays all addresses in the Flash address space and this overlay is in effect for one read
access only. Subsequent read access to the memory will return array data.
Unlike legacy data polling, use of the status register does not require comparison of sequential polling read
values or to targeted program data to determine embedded algorithm status. The lower byte of the status
register contains bits related to the results - success or failure - of the most recently completed embedded
operation. A Clear Status Register command is provided to reset the last completed embedded operation
portion of the status register. The upper byte of the status register contains bits that indicate dynamic
embedded operation progress relevant during factory troubleshooting. It is recommended that user software
enable capture of the entire status word to enable failure diagnosis. However, the upper bits of status should
be masked or otherwise treated as don't care in terms of evaluating the device status.
Status Register usage is optional and its presence will not inhibit migration to 65 nm MirrorBit GL or MirrorBit
Eclipse GL devices on existing designs. Spansion recommends software modification to take advantage of
this feature by querying the Lower Software Bits at offset xCh in Autoselect mode. If bit 0 is set, Status
Register functionality is supported.
Details of the Status Register implementation can be found in the S29GL-R and S29GL-S data sheets. The
Status Register bit definitions are provided in Table 3.3. Status determination using the Status Register is
illustrated in the flow diagram in Figure 3.3. Provided below is a C source code excerpt from Spansion's Low
Level Driver software (LLD rev 7.2.0) that illustrates how to augment existing drivers to also support Status
Register usage. The Status Register provides a simplified and robust method for status determination and
reduces code required for status determination by ~70%.
Figure 3.3 Status Register Usage Flow Diagram
Write
Status Read
Command
Embedded
Operation
Started
Actively
Programming
or Erasing
Yes
D7 = 0 ?
Read
No
No
Operation =
Erase Suspend?
D6 = 0 ?
Erase in
Suspension
No
Yes
Yes
D5 = 0 ?
No Erase in
Suspension
Operation =
Program Suspend?
Yes
Yes
Yes
Yes
No
Operation =
Program?
Yes
Yes
No
No
Operation =
Erase?
D4 = 0 ?
No
Erase
Successful
Program
Failed
Erase
Failed
D2 = 0 ?
Program
Successful
No
No Program
In Suspension
Program in
Suspension
Yes
DQ2 = 0?
No
Sector Not
Locked
Sector
Locked
Error
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A pplication
Note
Table 3.3 Status Register Definition
3.15.1
SR Bit
Name
Validity
At Reset
“1”
“0”
DQ15:8
Reserved
n/a
n/a
n/a
n/a
Active program or
erase operation
DQ7
Device Ready Bit
Always valid
“1”
No active
embedded
operation
DQ6
Erase Suspend
Status Bit
DQ7 = “1”
“0”
Erase in
suspension
No erase in
suspension
DQ5
Erase Status Bit
DQ7 = “1”
“0”
Erase failed
Erase successful
DQ4
Program Status
Bit
DQ7 = “1”
“0”
Program failed
Program
successful
DQ3
Reserved
n/a
n/a
n/a
n/a
DQ2
Program Suspend
Status Bit
DQ7 = “1”
“0”
Program in
suspension
No program in
suspension
DQ1
Sector Lock
Status Bit
DQ7 = “1”
“0”
Sector locked
error
Sector not locked
DQ0
Reserved
n/a
n/a
n/a
n/a
Status Register Read C Source Example from LLD rev 7.2.0
/****************************************************************
*
* wlld_StatusRegReadCmd - Status register read command
*
* This function sends the status register read command before
* actualy read it.
*
* RETURNS: void
*
* ERRNO:
*/
#ifndef REMOVE_LLD_STATUS_REG_READ_CMD
void wlld_StatusRegReadCmd
(
FLASHDATA * base_addr,
/* device base address in system */
ADDRESS offset
/* address offset from base address */
)
{
FLASH_WR(base_addr, (offset & SA_OFFSET_MASK) + LLD_UNLOCK_ADDR1,
NOR_STATUS_REG_READ_CMD);
}
/****************************************************************
*
* lld_StatusGet - Determines Flash Status for GL-R device
*
* Note: This routine implements both (1) read status and check
* toggles (2) use read status command(GL-R device). The
* enable_status_cmd_g flag switch between these two status get
* methods. When calling this function, the WriteBufferProgramming
* flag needs to be set to 1 if the caller wants to check DQ1 for
* WriteBuffer abort. Then the flag needs to be set back to 0. See
* lld_poll for example of how to use the WriteBufferProgramming
10
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April 14, 2010
Ap pl ic atio n
* flag.
*
* RETURNS: DEVSTATUS
*
*/
#define DQ1_MASK
(0x02
#define DQ2_MASK
(0x04
#define DQ5_MASK
(0x20
#define DQ6_MASK
(0x40
*
*
*
*
No t e
LLD_DEV_MULTIPLIER)
LLD_DEV_MULTIPLIER)
LLD_DEV_MULTIPLIER)
LLD_DEV_MULTIPLIER)
/*
/*
/*
/*
DQ1
DQ2
DQ5
DQ6
mask
mask
mask
mask
for
for
for
for
all
all
all
all
interleave
interleave
interleave
interleave
devices
devices
devices
devices
*/
*/
*/
*/
#define DQ6_TGL_DQ1_MASK (dq6_toggles >> 5) /* Mask for DQ1 when device DQ6 toggling */
#define DQ6_TGL_DQ5_MASK (dq6_toggles >> 1) /* Mask for DQ5 when device DQ6 toggling */
DEVSTATUS lld_StatusGet
(
FLASHDATA * base_addr,
ADDRESS
offset
)
{
FLASHDATA
FLASHDATA
FLASHDATA
FLASHDATA
/* device base address in system */
/* address offset from base address */
dq6_toggles;
status_read_1;
status_read_2;
status_read_3;
if( enable_status_cmd_g == 0 )
/* Do not use Read Status */
/* Command */
{
status_read_1 = FLASH_RD(base_addr, offset);
status_read_2 = FLASH_RD(base_addr, offset);
status_read_3 = FLASH_RD(base_addr, offset);
/* Any DQ6 toggles */
dq6_toggles = ((status_read_1 ^ status_read_2) &
Toggles between read1 and read2 */
(status_read_2 ^ status_read_3) &
/* Toggles between read2 and read3 */
DQ6_MASK );
/* Check for DQ6 only */
/*
if (dq6_toggles)
{
/* Checking WriteBuffer Abort condition: Check for all devices */
/* that have DQ6 toggling also have Write Buffer Abort DQ1 set */
if (WriteBufferProgramming &&
((DQ6_TGL_DQ1_MASK & status_read_1) == DQ6_TGL_DQ1_MASK) )
return DEV_WRITE_BUFFER_ABORT;
/* Checking Timeout condition: Check for all devices that have */
/* DQ6 toggling also have Time Out DQ5 set. */
if ((DQ6_TGL_DQ5_MASK & status_read_1) == DQ6_TGL_DQ5_MASK )
return DEV_EXCEEDED_TIME_LIMITS;
/* No timeout, no WB error */
return DEV_BUSY;
}
else
{
/* no DQ6 toggles on all devices */
/* Checking Erase Suspend condition */
April 14, 2010
Designs_for_GL_Products
11
A pplication
Note
status_read_1 = FLASH_RD(base_addr, offset);
status_read_2 = FLASH_RD(base_addr, offset);
/* Checking Erase Suspend condition */
if ( ((status_read_1 ^ status_read_2) & DQ2_MASK) == 0)
return DEV_NOT_BUSY;
/* All devices DQ2 not toggling */
if (((status_read_1 ^ status_read_2) & DQ2_MASK) == DQ2_MASK)
return DEV_SUSPEND;
/* All devices DQ2 toggling */
else
return DEV_BUSY;
/* Wait for all devices DQ2 toggling */
}
}
else
{
/*............................................................*/
/* Use Status Register Read command to read the status
*/
/* register. This is for GL-R/S devices only
*/
/*............................................................*/
#ifdef STATUS_REG
volatile FLASHDATA status_reg;
wlld_StatusRegReadCmd( base_addr, offset );
Issue status register read command */
status_reg = FLASH_RD(base_addr, offset);
/* read the status register */
/*
if ( (status_reg & DEV_RDY_MASK) != DEV_RDY_MASK
) /* Are all devices done bit 7 is
1 */
return DEV_BUSY ;
if ( status_reg & DEV_ERASE_MASK )
return DEV_ERASE_ERROR;
/* Any erase error */
if ( status_reg & DEV_PROGRAM_MASK )/* Any program error */
return DEV_PROGRAM_ERROR;
if ( status_reg & DEV_SEC_LOCK_MASK )/* Any sector lock error */
return DEV_SECTOR_LOCK;
return DEV_NOT_BUSY ;
#endif
return DEV_STATUS_UNKNOWN;
/* should never get here */
}
}
3.16
Accelerated Programming
The S29GL-R does not support accelerated programming, unlike the S29GL-N and S29GL-P. The maximum
voltage that should be applied to the WP#(/ACC) input is VCC + 0.5 V. The S29GL-N and S29GL-P tolerated
up to 12.5 V on the WP#/ACC input.
The S29GL-S does not support accelerated programming, unlike the S29GL-N and S29GL-P. The maximum
voltage that should be applied to the WP#(/ACC) input is VCC + 0.5 V. The S29GL-N and S29GL-P tolerated
up to 12.5 V on the WP#/ACC input.
12
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Ap pl ic atio n
3.17
No t e
Single Word and Multi-pass Write Buffer Programming
The S29GL-R will not support the single word program command and will only support single pass
programming of each 16 word aligned page using the write buffer programming command. Up to 32 words
can be programmed concurrently per write buffer program operation. This restriction on programming
methods will require system software modification to accommodate.
The S29GL-S will support both single word and write buffer programming commands, consistent with the
S29GL-N and S29GL-P. Unrestricted multi-pass programming is allowed.
4. Power On Reset Timing
The use of a micro controller to perform embedded operations within 65 nm GL Flash requires asymmetric
reset timing. At power on, the flash requires more time in reset to self configure than it does during a warm
reset. Table 4.1 and Figure 4.1 detail the power on reset timing requirements for GL Flash Table 4.2 and
Figure 4.2 detail the warm reset timing requirements for existing and future GL Flash.
Table 4.1 Power On Reset Timing Requirements
Parameter
Description
GL-N
tVCS
VCC Setup Time to first access (min)
tVIOS
VIO Setup Time to first access (min)
GL-P
GL-R
GL-S
50 µs
35 µs
300 µs
300 µs
35 µs
35 µs
300 µs
300 µs
tRPH
RESET# Low to CE# Low (min)
550 ns
35 µs
35 µs
35 µs
tRP
RESET# Low to RESET# High (min)
500 ns
35 µs
200 ns
200 ns
tRH
RESET# High to CE# Low (min)
50 ns
200 ns
200 ns
50 ns
GL-R
GL-S
Note:
For GL-R & GL-S, tRP + tRH must be not be less than tRPH
Figure 4.1 Power-Up Reset Timing
VCC
tVIOS
VIO
tVCS
tRP
RESET#
tRH
tRPH
CE#
Note
The sum of tRP & tRH must be equal to or greater than tRPH
Table 4.2 Warm Reset Timing Requirements
Parameter
Description
GL-N
GL-P
tRPH
RESET# Low to CE# Low (min)
20 µs
35 µs
35 µs
35 µs
tRP
RESET# Low to RESET# High (min)
500 ns
35 µs
200 ns
200 ns
tRH
RESET# High to CE# Low (min)
50 ns
200 ns
200 ns
50 ns
Notes:
1. For GL-N, tRP = 20 µs during embedded operation and 500ns not during embedded operation.
2. For GL-R & GL-S, tRP + tRH must be not be less than tRPH.
April 14, 2010
Designs_for_GL_Products
13
A pplication
Note
Figure 4.2 Warm Reset Timing
tRP
RESET#
tRH
tRPH
CE#
Note:
The sum of tRP & tRH must be equal to or greater than tRPH
5. Specification Parameter Comparison
Table 5.1 provides a side by side reference of various AC and DC specification differences between GL
families (less reset timing requirements). All parameters should be reviewed against actual application
implementations to ensure successful migration. Special attention should be given to review of control signal
relationships during write cycles as well as software suspend & resume timing when evaluating migration to
the S29GL-S family.
Table 5.1 AC and DC Specification Differences (Sheet 1 of 2)
Parameter
Description
GL-N
GL-P
GL-R
GL-S
Read Cycle Time (512 Mbit, VCC=VIO) (min)
100 ns
100 ns
100 ns
90 ns
Intra-Page Access Time (min)
25 ns
25 ns
25 ns
20 ns
Async Read
tACC / tCE
tPACC
tOE
OE# to data (max)
25 ns
25 ns
25 ns
25 ns
tDF
Control negate to data high-Z (max)
20 ns
20 ns
15 ns
15 ns (1)
tWC
Write Cycle Time (512 Mbit, VCC=VIO) (min)
100 ns
100 ns
100 ns
60 ns
tWP
WE# Enable to Disable (min)
35 ns
35 ns
35 ns
25 ns
tWPH
WE# Disable to Enable (min)
30 ns
30 ns
30 ns
20 ns
Datas Setup to WE# Disable (min)
45 ns
30 ns
45 ns
15 ns
WE# Disable to Address (min)
0 ns
0 ns
30 ns (2)
30 ns
tESL
Erase - Suspend to Resume (max)
0 ns
20 µs
30 µs
35 µs
tERS
Erase - Resume to Suspend (typ)
0 ns
0 ns
50 µs (3)
100 µs (3)
tPSL
Program - Suspend to Resume (max)
0 ns
15 µs
30 µs
35 µs
tPRS
Program - Resume to Suspend (typ)
0 ns
0 ns
75 µs (3)
100 µs (3)
Async Write
tDS
tSR/W
Suspend Resume
Throughput
x16 Async Read (512 Mbit, VCC=VIO) (max)
20 MB/s
18 MB/s
20 MB/s
20 MB/s
x16 Page Read (512 Mbit, VCC=VIO) (max)
58 MB/s
56 MB/s
67 MB/s
82 MB/s
Programming (typical)
133 KB/s
133 KB/s
133 KB/s
1.5 MB/s
Erase (typical)
256 KB/s
256 KB/s
256 KB/s
700 KB/s
55 mA
45 mA
60 mA
Power Usage
14
ICC1
Active VCC Read (5 MHz, max)
50 mA
90 mA
90 mA
95 mA
100 mA
5 µA
500 µA
500 µA
20 mA
90 mA
80 mA
N/A
N/A
ICC3
Active Program or Erase (max)
ICC5
Reset Current (max)
IACC
Accelerate Program Current_VCC (max)
Designs_for_GL_Products
April 14, 2010
Ap pl ic atio n
No t e
Table 5.1 AC and DC Specification Differences (Sheet 2 of 2)
Parameter
Description
GL-N
GL-P
GL-R
GL-S
IACC
Accelerate Program Current_WP#/ACC (max)
20 mA
20 mA
N/A
N/A
VHH
WP#/ACC Input - Accelerated Program
Voltage (max)
12.5 V
12.5 V
N/A
N/A
Notes:
1. For GL-S, tDF = 15 ns when VIO = VCC, otherwise, tDF = 20 ns
2. The tSR/W timing parameter only applies in the usage case where CE# is maintained low between a write cycle and a subsequent read
cycle. In this case, an Address change must be delayed for 30 ns minimum from the rising edge of WE# or the data output on the
subsequent read cycle may be incorrect.
3. The minimum tERS and tPRS are 60 ns; however, the stated typical values are necessary for the embedded operations to progress to
completion.
April 14, 2010
Designs_for_GL_Products
15
A pplication
Note
6. Revision History
Section
Description
Revision 01 (February 14, 2008)
Initial Release
Revision 02 (May 22, 2008)
GL Family Feature Comparison
Updated GL Family Feature Comparison table
Feature Difference Discussion
Added Sector Size and Data Size sections
Revision 03 (December 18, 2008)
Packaging
Specification Parameter Comparison
Removed sections Automatic Cache Line and Bit Field Programming
Updated Packaging section
Updated AC and DC Specification Differences table
Revision 04 (September 17, 2009)
Global
General updates
Revision 05 (April 14, 2010)
Global
16
General updates
Designs_for_GL_Products
April 14, 2010
App l ic atio n
No t e
Colophon
The products described in this document are designed, developed and manufactured as contemplated for general use, including without
limitation, ordinary industrial use, general office use, personal use, and household use, but are not designed, developed and manufactured as
contemplated (1) for any use that includes fatal risks or dangers that, unless extremely high safety is secured, could have a serious effect to the
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any use where chance of failure is intolerable (i.e., submersible repeater and artificial satellite). Please note that Spansion will not be liable to
you and/or any third party for any claims or damages arising in connection with above-mentioned uses of the products. Any semiconductor
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Other names used are for informational purposes only and may be trademarks of their respective owners.
April 14, 2010
Designs_for_GL_Products
17