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OmniScan® i X High-Speed Industrial
Flaw Detector
FEATURES
The New Standard in Ultrasound industrial Flaw detector
The new OmniScan® iX is an industrial ultrasonic flaw detector designed for highspeed immersion or nonimmersion testing of critical industrial components. This
powerful and flexible instrument can be configured for 2, 4, or 8 conventional ultrasound channels. It features a high-resolution VGA display, data storage, C-scan
and strip chart display, 16 logical alarms, 16 analog outputs, helicoidal, and other
multiple scan modes. The compact OmniScan iX is housed in a rugged benchtop
casing and is also available in a rack-mount version, or with a swivel-arm assembly for easy integration into inline production testing systems. Typical applications for the OmniScan iX include automotive components, aerospace composite
materials, weld or disbond testing, and other critical manufactured parts that must
be compliant to strict test code requirements.
• Data storage �����������
capability
(internal and external)
• Strip chart display
• 16 real-time alarms
• 16 real-time analog outputs (at PRF)
• 4 digital inputs
• Remote control from PC
• Multiple A-scans
• A-scan and C-scan imaging
• 19-in., 5U rack-mount version
• TomoView™-compatible for data
analysis and/or acquisition
• Remote control functions, for custom
programming
• 2-axis mechanical encoders
• Multiple scan modes, including
helicoidal
• Multiple channels (up to 8)
• TCG/DAC curves
• Interface gate for immersion testing
• Touch screen
• VGA output
• Maximum PRF is equal to the PRF
divided by the number of channels
(up to 12 kHz)
• USB ports for keyboard, mouse,
printer, and external storage
• Back-wall echo attenuator
(available at the end of 2006)
The OmniScan iX is a powerful, integrated, cost-effective
solution, providing multiple channels at an affordable price.
√ Component testing
√ Immersion tanks
√ Aerospace
manufacturing
√ Automobile industry
√ Welded components
√ Integrated inspection
systems
√ GE DFO P3TF22,
P3TF30, P3TF31, and
P3TF35 qualified
TCG/DAC curves.
920-082
OmniScan i X Benefits and Features
Complete Integrated Solution
• Automatic gate synchronizes from previous gate for higher dynamic
range of thickness.
• A‑scan data storage and C-scan postprocessing capabilities
• Interface gate for surface following synchronization of measurement
gate and/or TCG/DAC curves
• Either positive or negative gate on RF signal (independent for each
gate)
• 16 alarms completely configurable on single-gate events or multiplegate events, filter for n occurrences from one or multiple channels
• Customizable color palette for amplitude and thickness C-scan
• 60 Hz A-scan refresh rate with overlays of envelope and peak inside
the gate
Rear view showing the numerous connectors enabling easy integration.
• Affordable price
• Rugged construction for industrial environment with rack-mount option
• Remote control functions, for custom programming from PC
• TomoView™-compatible for data analysis and/or acquisition
• Optional data library to access A‑scan and/or C-Scan on PC, for custom processing
Software Features
Full-featured C‑scan.
Hardware Features
• Data storage (internal and external)
• Multichannel configuration (up to 8 channels)
• PRF up to 12 kHz / number of channels
• Analog and alarm output compatibility with older systems
• 16 real-time fully programmable alarms
• 16 real-time analog outputs (at PRF)
• 4 digital inputs to remotely control the machine
• 2-axis mechanical encoders (option)
• 2‑axis mechanical encoder with data acquisition synchronization on
mechanical movement
Channel Configuration
Strip chart view.
• Each channel can have unique setups for multizone inspection.
• Surface following interface gate
• Built-in strip chart display and data storage
• Multiple A-scans
• A-scan and C-scan imaging
• TCG curves
• Multiple scan modes, including helicoidal
• Back-wall echo attenuator (available at the end of 2006)
• Monitoring of amplitude, peak position, crossing-level position, and
thickness on each gate
The OmniScan iX can be configured for pulse-echo, pitchand-catch, or sequence firing.
CH
1
CH
2
CH
3
CH
4
CH
5
CH
6
CH
7
CH
8
Pulse-echo configuration.
CH
1
CH
2
CH
3
CH
4
Pitch-and-catch configuration.
CH
5
CH
6
CH
7
CH
8
Component Testing
Component testing is typically performed under an assembly-line environment.
The OmniScan® iX is used to accept or reject (go-no-go testing) thousands of parts
a day. Multichannel instrument configurations lend themselves very well to assembly-line applications, which are aimed at detecting flaws within the various zones
of a part—not just under one particular area with one transducer. 16 alarm outputs
on the OmniScan iX allow the tracking of a particular zone and monitoring the
zone that is giving the alarm conditions.
Weld and Flaw Inspection in Tubular Goods
Tubular flaw detection can be configured using multiple channels, as necessary, to
achieve 100% inspection of critical defects. Inspections often require the ability to
interrogate for ID and OD notches and internal flaws or delaminations.
Often 5 pulse-echo channels are required: 2 transducers diametrically opposed
for axial-flaw detection; 2 transducers diametrically opposed for transverse flaw
detection; and one 0-degree probe for thickness- or laminar-flaw indications.
Additional channels could be required for oblique angles.
Billet Inspection
The ease of integration, channel flexibility, and the ability to invoke more advanced functionality makes the OmniScan iX an ideal instrument or centerpiece
for a newly integrated system or a well-suited replacement of an existing ultrasonic system.
Plate Inspection
Ultrasonic equipment for plate and sheet inspection often requires multichannel capacity for faster inspection speed and coverage. Typically, large element
transducers are used to detect flaws faster. The detected flaws are then sized using
a spherically focused transducer. The OmniScan iX offers a conventional UT
instrument replacement option for those not quite ready to adopt a phased array
approach.
Engine-Disc Inspection
Critical inspection of turbine engine discs requires a very sensitive ultrasonic flaw
detector capable of detecting small defects in difficult nickel-based metals. Such
instruments must be able to operate at high gains, with extremely low noise on
both the A-scan display as well as the analog output. The OmniScan iX meets these
very demanding requirements. Additional OmniScan iX features such as strip-chart
recorder, C-scan display, and back-echo attenuator make this a very versatile instrument. The OmniScan iX can easily drop into existing, older test stations, then later
transfer to a full functional station to perform on-board mapping/C-scan.
The OmniScan iXhas been qualified by GE Aircraft Engines and added to the DFO
as follows:
• P3TF22 Longitudinal Immersion Ultrasonic Inspection of Forgings to Flat Bottom Hole
Sensitivities
• P3TF30 High Sensitivity Ultrasonic Inspection of Forged Fine Grain Powder Alloy
• P3TF31 Ultrasonic Immersion Inspection of Powder Metallurgy Extruded Bars and Billets
• P3TF35 Side Drill Hole Ultrasonic Inspection
OmniScan® iX Specifications
Overall dimensions (W × H × D)
Benchtop version
375 mm × 238 mm × 185 mm (14.75 in. × 9.4 in. × 7.3 in.)
Rack-mount version
485 mm × 222 mm × 190 mm (19 in. × 8.7 in. × 7.5 in.)
Weight
6.5 kg (14.3 lb)
Display
800 × 600 10.4 in. TFT color LCD
Connectors
BNC (2, 4, or 8)
Number of pulsers/receivers
2, 4, or 8
Pulse output
50 V, 100 V, 200 V, 300 V ±10%
Pulse width
Adjustable from 30 ns to 1000 ns ±10%, resolution of 2.5 ns
Fall time
Less than 7 ns
Pulse shape
Negative square wave
Output impedance
Less than 7 Ω
OmniScan iX Options
Hardware Options
OMNI-IX-A-RACK1: OmniScan i X rackmount bracket option
Pulser/Receiver
Pulser
Receiver
The OmniScan i X is also available as a 19-in., 5U rack-mount
version for easier integration into production environments.
Receiver gain range
0–100 dB, by steps of 0.1 dB
Maximum input signal
20 V p-p (screen at 128%)
Minimum sensibility
200 µV p-p (screen at 128%)
Noise referred to input
160 µV p-p (26 µV RMS) (128%)
Input impedance
50 Ω
Input filter
(100% bandwidth)
Bandwidth of the system
Centered at 1 MHz (1.5 MHz), centered at 2 MHz (2.25 MHz), centered
at 5 MHz (4 MHz), centered at 10 MHz (12 MHz), centered at 15 MHz,
centered at 20 MHz, 0.25–2.5 MHz, 2–25 MHz BB
0.25–35 MHz (–3 dB)
Rectifier
Positive, negative, full unrectified
Mode
Smoothing
PE (pulse-echo), PC (pitch-and-catch), TT (through-transmission).
In PC mode, the maximum number of pulsers equals the number of
channels divided by 2.
Digital
Number of points
16
TCG range
Up to 40 dB
Maximum gain slope
20 dB/µs
A-scan acquisition rate
Maximum pulsing rate
6000 A-scans/s
(PRF/N, where N = number of channels) (512-point A-scan)
12 kHz (C-scan + Alarm mode). Up to 6 kHz with full A-scan recording
Real-time averaging
2, 4, 8, 16
Quantity
3: I (synchro), A and B (measure)
Synchronization
I, A, B referenced on main bang, B referenced on gate I or A (postsynchronization)
• OmniScan iX instrument
A-scan recording (TOFD)
6000 A-scans/s (512-point A-scan) (3 MB/s transfer rate)
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OmniScan software
C-scan type data recording
12,000 (A1, A2, A3, T1, T2, T3) (3 gates); 12 kHz (lower frequency for
corrosion mapping)
Internal 8 GB Microdrive®
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User’s manual
TCG
Data acquisition
Data processing
Gates
Data storage
Storage
Data visualization
Refresh rate
60 Hz
Modes
A-scan, B-scan, C-scan, strip charts, multiple A-scans, and TOFD
On time
1 Hz–12 kHz
On encoder
On 1 or 2 axes divided by 1 to 65,536 steps
Number of alarms
16 (programmable, hold time and delay, filters for n occurrences)
Conditions
Any logical combination of gates
Signal
Amplitude or time of flight of gate A or B
Analog outputs (at full PRF)
16 (0 V to +5 V) (programmable for each gate)
Digital inputs
4 programmable DIN
OMNI-IX-A-ACC1: OmniScan i X accessory kit includes the following:
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1 external keyboard,
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1 optical mouse,
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1 storage USB key
OMNI-IX-A-SWIV: OmniScan iX swivelarm assembly
OMNI-IX-A-SCASE: OmniScan iX hard
carrying case
Software Options
OMNI-IX-SO-ENC1: OmniScan iX software option to activate two encoder
inputs on the instrument
OMNI-IX-SO-BEA*: OmniScan i X software option to activate back wall echo
attenuator on the instrument
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available the end of 2006)
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Standard Inclusions
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Ethernet® cable
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NDT Remote Control Software
Library 2.0
Data synchronization
Outputs and inputs
Olympus NDT
OmniScan_iX_EN_0609 • Printed in Canada • Copyright © 2005–2006 by Olympus NDT. All Rights Reserved.
All specifications are subject to change without notice.
Olympus and the Olympus logo are registered trademarks of Olympus Corporation.
R/D Tech, the R/D Tech logo, OmniScan, and the OmniScan logo are registered trademarks, and “Innovation in NDT” and TomoView are trademarks of Olympus NDT Corporation in Canada, the United States, and/or other countries.
Other company or product names mentioned in this document may be trademarks or registered trademarks of their respective owners.
505, boul. du Parc-Technologique
Québec (Québec) G1P 4S9
Canada
[email protected]
www.olympusNDT.com