Optical Anisotropies in Organic Semiconductors S. Brown1, R. Schlitz1, R. Grote3, J. Driscoll3, M. Chabinyc1, R. Osgood3,4, J. Schuller2 Introduction We seek to understand the relationship between morphology and optical properties. Optical anisotropy in organic semiconductor films is ubiquitous due to structural anisotropies in the films’ molecular constituents. This optical anisotropy becomes critical when designing devices, such as lighttrapping solar cells, which have geometrical anisotropies. In addition, a material’s response to light gives us insight into the electronic properties of the material such as the orientation of the excited dipoles that form excitons, and the environment that these dipoles are in. Polymer orientation impacts 1 light trapping solar cells Measuring anisotropy in 2 polymers P(NDI2OD-T2) allows us to compare two different morphologies Edge-on Face-on P(NDI2OD-T2) spun and annealed at 150°C has a face-on morphology whereas annealing just below the melting point at 305°C leads an edge-on morphology Ellipsometry is a good first pass for determining anisotropic absorption Momentum-resolved spectroscopy Utilizes the fact that dipole radiation is angle-dependent Detector position [3] [4] By placing a detector in the back focal plane light intensity can be measured as a function of emitted angle (or momentum-vector of emitted light) – this allows for the unique determination of the orientation of the emitting dipole PL intensity Spectroscopic ellipsometry is a quick traditional technique to determine anisotropic optical constants, but it is not as sensitive to out-of-plane features and requires model-dependent fitting P3HT has a preferred absorption direction Momentum-resolved photoluminescence is more precise for measuring anisotropy [5] There are special points in the back focal plane that have PL from just inplane or out-of-plane dipoles, allowing separate measurement of in-plane or out-of-plane dipoles Our setup has momentum-resolution on the input and the output Having momentum-resolution on both the input and output enables new measurements such as momentum-resolved photoluminescence excitation which can map absorption spectra. On-going work utilizes this extended capability to give even deeper insights into the optical properties of these materials P3HT, Poly(3-hexylthiophene), is a well-studied photoacceptor As spun P3HT chains lie parallel to substrate surface zP3HT is a model orientation of P3HT where the chains are perpendicular to the substrate Photoexcitation is mainly along the polymer backbone Momentum-resolved photoluminescence (MR-PL) is free-parameter free and much more sensitive to out-of-plane features compared to ellipsometry. Momentum-resolved PL reveals that there is much more out-of-plane dipole strength than would be expected from the ellipsometry measurements. We would like to acknowledge Lee Richter of NIST for the P3HT ellipsometry data. We would like to thank the Center for Energy Efficient Materials (a DOE funded research center), the NSF through an Early Career Award, and the Hellman Fellows Fund for funding. References: An out-of-plane absorption direction increases absorption Light trapping/field enhancing solar cells, such as plasmonic and gap mode solar cells, enhance the component of the electric field perpendicular to the substrate Electric field enhancement and photoexcitation directions must be aligned for maximum absorption Acknowledgements: The higher precision from MR-PL is able to resolve a difference in the 950nm peak shoulder in the out-of-plane direction for the face-on morphology – the absence of this shoulder suggests a more amorphous environment in the outof-plane direction 1. Grote, R. R., Brown, S. J., Driscoll, J. B., Osgood, R. M. & Schuller, J. A. Morphology-dependent light trapping in thin-film organic solar cells. Opt. Express 21, A847–A863 (2013). 2. Rivnay, J. et al. Drastic Control of Texture in a High Performance n-Type Polymeric Semiconductor and Implications for Charge Transport. Macromolecules 44, 5246–5255 (2011). 3. Modified from Maschen’s work, via http://commons.wikimedia.org/wiki/File:Elem-doub-rad-pat-pers.svg in the public domain. 4. Modified from BenFrantzDale, via http://en.wikipedia.org/wiki/File:BackFocalPlane.svg under the CC BYSA 3.0 license (http://creativecommons.org/licenses/by-sa/3.0/). 5. Modified from Schuller, J. A. et al. Orientation of luminescent excitons in layered nanomaterials. Nat Nano 8, 271–276 (2013) under fair use. 1. Materials, University of California, Santa Barbara 2. Electrical and Computer Engineering, University of California, Santa Barbara 3. Department of Electrical Engineering, Columbia University 4. Applied Physics, Columbia University
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