1. INTRODUCTION PDC FV Series green type capacitors are manufactured by using environmental friendly material without lead or cadmium. These capacitors feature series connection of multi-layer capacitor units in a MLCC to realize high voltage performance. This special design can distribute voltage gradients throughout the entire capacitor, so as to prevent short circuit failure. It is a safety design for LCD back-lighting inverter application. 2. FEATURES 3. APPLICATIONS a. Special interior design offers high voltage rating in a given case size. b. High reliability and stability. c. RoHS compliant a. b. c. d. e. f. DC to DC converter. High voltage coupling/DC blocking. Back-lighting inverters. LAN/WLAN interface. Modem. Power supplies. 4.HOW TO ORDER FV 21 X 102 K 402 E F G PDC Family Size Dielectric Capacitance Tolerance Rated voltage Packaging Thickness Control Code Inch (mm) 21: 2211 (5728) N:C0G X: X7R Two significant digits followed by no. of zeros. And R is in place of decimal point. eg.: R47=0.47pF 0R5=0.5pF 1R0=1.0pF 0 100=10x10 =10pF E: Tape and Reel, E: 1.60±0.20mm G: RoHS Two significant Embossed Tape F: 2.00±0.20mm compliant digits followed by no. of zeros. And R No Code: Bulk G: 2.50±0.20mm is in place of decimal point. B=±0.1pF C=±0.25pF D=±0.5pF F=±1% G=±2% J=±5% K=±10% M=±20% 402= 4000 VDC 502= 5000 VDC 602= 6000 VDC 1 5. EXTERNAL DIMENSIONS Size Inch (mm) 2211 (5728) L (mm) 5.70±0.40 W (mm) 2.80±0.30 T (mm) Remark MB min (mm) 1.60±0.20 # 2.00±0.20 # 2.50±0.20 # L 0.30 T W MB MB Fig. 1 The outline of MLCC 6.GENERAL ELECTRICAL DATA Dielectric C0G X7R Size 2211 2211 Rated voltage (WVDC) 6KV 4KV 4pF to 100pF 150pF to 2200pF Capacitance range* Capacitance tolerance Tan δ* Cap≤5pF 5pF<Cap<10pF Cap≥10pF Cap<30pF Cap≥30pF : B (±0.1pF), C (±0.25pF) : C (±0.25pF), D (±0.5pF) : F (±1%), G (±2%), J (±5%),K (±10%) : Q≥400+20C : Q≥1000 J (±5%), K (±10%), M (±20%) ≤2.5% ≥100GΩ or R·C≥1000Ω-F whichever is smaller ≥10GΩ or R·C≥500Ω-F whichever is smaller 6000VDC 4400VDC Operating temperature -55~+125℃ -55~+125℃ Temperature coefficient ±30ppm/℃ Insulation resistance at 500Vdc for 60 seconds Dielectric Strength Termination ±15% Ag/Ni/Sn (Lead free termination) * Measured at the condition of 30~70% related humidity. C0G: Apply 1.0±0.2Vrms, 1.0MHz±10% for Cap≤1000pF and 1.0±0.2Vrms, 1.0kHz±10% for Cap>1000pF, 25°C at ambient temperature X7R: Apply 1.0±0.2Vrms, 1.0kHz±10%, at 25°C ambient temperature. 2 7.CAPACITANCE RANGE Capacitance DIELECTRIC SIZE RATED VOLTAGE (VDC) 1.5pF (1R5) 1.8pF (1R8) 2.2pF (2R2) 2.7pF (2R7) 3.3pF (3R3) 3.9pF (3R9) 4.0pF (4R0) 4.7pF (4R7) 5.6pF (5R6) 6.8pF (6R8) 8.2pF (8R2) 10pF (100) C0G (NP0) 2211 6000 X7R 2211 4000 12pF (120) 15pF (150) 18pF (180) 22pF (220) 27pF (270) 33pF (330) 39pF (390) 47pF (470) 56pF (560) 68pF (680) 82pF (820) 100pF (101) 120pF (121) 150pF (151) 180pF (181) 220pF (221) 270pF (271) 330pF (331) 390pF (391) 470pF (471) 560pF (561) 680pF (681) 820pF (821) 1,000pF (102) 3 8.RELIABILITY TEST CONDITIONS AND REQUIREMENTS No. Item 1. Visual and Test Condition Requirements --- * No remarkable defect. Mechanical * Dimensions to conform to individual specification sheet. 2. Capacitance Class I: (C0G) * Shall not exceed the limits given in the detailed spec. Cap≤1000pF, 1.0±0.2Vrms, 1MHz±10% C0G: Cap≥30pF, Q≥1000; Cap<30pF, Q≥400+20C (Dissipation Cap>1000pF, 1.0±0.2Vrms, 1KHz±10% X7R: ≤2.5% Factor) Class II: (X7R) 3. Q/ D.F. 1.0±0.2Vrms, 1kHz±10% 4. Temperature With no electrical load. T.C. Operating Temp Coefficient C0G -55~125°C at 25°C X7R -55~125°C at 25°C 5. Insulation T.C. C0G X7R * To apply voltage at 500VDC for 60 sec. Resistance 6. Dielectric Strength * To apply voltage: UR ≤ 5KV : 1.1 times of UR UR > 5KV : 1.0 time of UR Capacitance Change Within ±30ppm/℃ Within ±15% Class I (C0G) : ≥100GΩ or RxC≥1000Ω-F whichever is smaller. Class II (X7R) : ≥10GΩ or RxC≥500Ω-F whichever is smaller. * No evidence of damage or flashover during test. * Duration: 1 to 5 sec. 7. Solderability * Solder temperature: 245±5°C 8. Resistance to Soldering Heat 9. Temperature Cycle 10. Humidity (Damp Heat) Steady State 75% min. coverage of all metalized area. * Dipping time: 5±0.5 sec. * Solder temperature: 260±5°C * Dipping time: 10±1 sec * Preheating: 120 to 150°C for 1 minute before immerse the capacitor in a eutectic solder. * Before initial measurement (Class II only): Perform 150+0/-10°C for 1 hr and then set for 48±4 hrs at room temp. * Measurement to be made after keeping at room temp. for 24±2 hrs (Class I) or 48±4 hrs (Class II). * Conduct the five cycles according to the temperatures and time. Step Temp. (°C) Time (min.) 1 Min. operating temp. +0/-3 30±3 2 Room temp. 2~3 3 Max. operating temp. +3/-0 30±3 4 Room temp. 2~3 * Before initial measurement (Class II only): Perform 150+0/-10°C for 1 hr and then set for 48±4 hrs at room temp. * Measurement to be made after keeping at room temp. for 24±2 hrs (Class I) or 48±4 hrs (Class II). * Test temp.: 40±2°C * Humidity: 90~95% RH * Test time: 500+24/-0hrs. * Measurement to be made after keeping at room temp. for 24±2 hrs (Class I) or 48±4 hrs (Class II). * No remarkable damage. * Cap change: C0G : within ±2.5% or ±0.25pF whichever is larger. X7R : within ±7.5% * 25% max. leaching on each edge. * No remarkable damage. * Cap change: C0G : within ±2.5% or ±0.25pF whichever is larger. X7R : within ±15% * Q/D.F.: C0G : X7R : ≤2.0 × Initial requirement ≤1.5 × Initial requirement * I.R.≥ 0.25 × initial requirements. * No remarkable damage. * Cap change: C0G : within ±5% or ±2pF whichever is larger X7R : within ±15% * Q/D.F Value: C0G : Cap ≥30pF 10pF ≤ Cap < 30pF Cap < 10pF X7R : : : : Q≥350; Q≥275+2.5C Q≥200+10C ≤7.0% * I.R.: ≥1GΩ or RxC≥50Ω-F whichever is smaller. * No remarkable damage. * Cap change: C0G : within ±3% or ±3pF whichever is larger. X7R : within ±20% * Test temp.: 11. High Temperature 125±3°C * To apply voltage: Load 100% of rated voltage. (Endurance) * Test time: 1000+24/-0 hrs. * Measurement to be made after keeping at room temp. for 24±2 hrs (Class I) or 48±4 hrs (Class II). * Q/D.F Value: C0G : Cap ≥30pF 10pF ≤ Cap < 30pF Cap < 10pF X7R : : : : Q≥350; Q≥275+2.5C Q≥200+10C ≤7.0% * I.R.: ≥1GΩ or RxC≥50Ω-F whichever is smaller. 4 8.RELIABILITY TEST CONDITIONS AND REQUIREMENTS(Cont.) No. Item Test Condition 12. Resistance * The middle part of substrate shall be pressurized by * No remarkable damage. to Flexure of means of the pressurizing rod at a rate of about 1 * Cap change: Substrate mm per second until the deflection becomes 1 mm. within ±10% 20 Requirements (This capacitance change means the change of capacitance under specified flexure of substrate from the capacitance measured before the test.) R = 230 50 1mm 45±1 13. Adhesive Strength of Termination 45±1 * Capacitors mounted on a substrate. A force of 5N * No remarkable damage or removal of the terminations. applied perpendicular to the place of substrate and parallel the line joining the center of terminations for 10±1 sec. 5N PC Board Capacitor 5
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