Emittance Diagnostics ¾Emittance, what is it ? ¾Emittance, why measuring it ? ¾How to measure it ? ¾What can go wrong ? CAS Beam diagnostic Dourdan, 2.6.2008 Hans Braun / CERN Emittance, what is it ? particle angle x’ particle position x ε = Area in x, x’ plane occupied by beam particles divided by π Beam envelope along beamline x w z converging beam beam waist x’ x’ x’ x x 2w Along a beamline the orientation and aspect ratio of beam ellipse in x, x’ plane varies, but area πε remains constant Beam width along z is described with w( z ) = β ( z) ε diverging beam x Beam ellipse and its orientation is described by 4 parameters ε , β ,α , γ called Courant - Snyder or Twiss parameters ε = γ x 2 + 2 α x x' + β x' 2 the three ellipse orientation parameters β ,α , γ are connected by the relation γ = 1+ α 2 β therefore only of these parameters are independen d α βε is the beam half width γε is the beam half divergence describes how strong x and x' are correlated. for α > 0 beam is converging , for α < 0 beam is diverging. for α = 0 beam size has minimum (waist) or maximum (anti - waist) Transport of single particle described with matrix algebra drift quadrupole drift x ⎛ x1 ⎞ ⎜⎜ ⎟⎟ ⎝ x1 ' ⎠ 1 z 2 LA ⎛ x2 ⎞ ⎜⎜ ⎟⎟ = M ⎝ x2 ' ⎠ LC LB ( ( ⎛ x ⎞ ⎛ 1 LC ⎞ ⎛ ⎛x ⎞ cos k LB ⎟⎟ ⋅ ⎜⎜ ⋅ ⎜⎜ 1 ⎟⎟ = M C ⋅ M B ⋅ M A ⋅ ⎜⎜ 1 ⎟⎟ = ⎜⎜ ⎝ x1 ' ⎠ ⎝ 0 1 ⎠ ⎝ − k sin k LB ⎝ x1 ' ⎠ ⎛1 L⎞ ⎟⎟ M Drift = ⎜⎜ ⎝0 1 ⎠ ⎛ x2 ⎞ ⎜⎜ ⎟⎟ ⎝ x2 ' ⎠ ( ) ( ) ⎛ cos k L M Quadrupole = ⎜⎜ ⎝ − k sin k L generic names of matrix elements 1 ( ) ( ) ) ) k sin k L ⎞ ⎟ cos k L ⎟⎠ ⎛c s⎞ ⎟⎟ M = ⎜⎜ c ' s ' ⎝ ⎠ 1 ( ( ) ) k sin k LB ⎞⎟ ⎛ 1 L A ⎞ ⎛ x1 ⎞ ⎟⋅⎜ ⎟ ⋅⎜ cos k LB ⎟⎠ ⎜⎝ 0 1 ⎟⎠ ⎜⎝ x1 ' ⎟⎠ Transport of Twiss parameters β, α, γ of beam ellipse drift drift quadrupole ⎛ β2 ⎞ ⎜α ⎟ ⎜ 2⎟ ⎜γ ⎟ ⎝ 2⎠ x ⎛ β1 ⎞ ⎜α ⎟ ⎜ 1⎟ ⎜γ ⎟ ⎝ 1⎠ 1 z 2 LA LC LB ⎛ x 2 ⎞ ⎛ c s ⎞ ⎛ x1 ⎞ ⎜⎜ ⎟⎟ = ⋅⎜⎜ ⎟⎟ ⋅ ⎜⎜ ⎟⎟ x ' ⎝ 2 ⎠ ⎝ c' s ' ⎠ ⎝ x1 ' ⎠ ⇒ β 2 = c 2 β1 − 2 c s α 1 + s 2 γ 1 w22 = c 2 β1 ε − 2 c s α 1 ε + s 2 γ 1 ε ⎛ β2 ⎞ ⎜α ⎟ ⎜ 2⎟= ⎜γ ⎟ ⎝ 2⎠ | ⋅ε ⎛ c2 s 2 ⎞ ⎛ β1 ⎞ − 2c s ⎜ ⎟ ⎜ ⎟ ⎜ − c c' c s '+c' s − s s ' ⎟ ⋅ ⎜ α 1 ⎟ ⎜ c' 2 2 ⎟ ⎜ γ 1 ⎟⎠ c s s 2 ' ' ' − ⎝ ⎝ ⎠ So far we implicitly assumed that beam occupies x, x’ space area with a sharp boundary particle density in x, x’ space transverse beam profile surface πε projection on x axis ∞ f ( x) = ∫ ρ ( x, x' ) dx' −∞ 2w beamwidth w = βε In reality beam density in x, x’ space is rarely a constant on a well defined area but often like this particle density in x, x’ space transverse beam profile surface πε ? projection on x axis ∞ f ( x) = ∫ ρ ( x, x' ) dx' −∞ beamwidth ? Definition of wRMS +∞ wRMS = ∫ (x − x COG ) 2 f ( x) dx −∞ +∞ ∫ f ( x) dx Commonly used definitions of emittance −∞ +∞ εrms , 1 sigma r.m.s. emittance ε2rms , 2 sigma r.m.s. emittance ⇔ wRMS = βε ⇔ wRMS = xCOG = βε ∫x f ( x) dx −∞ +∞ ∫ f ( x) dx −∞ 2 Definition of w90 ε90% , 90% emittance ⇔ w90 = βε +W90 ∫ f ( x) dx −W90 +∞ ∫ f ( x) dx −∞ = 90% Relations between different emittance definitions Always For Gauss beam distribution only εrms , 68.3% of beam ε2rms = 4 εrms ε90% = 2.7055 εrms wrms = σX w90% =1.6449 σX ε90% , 90% of beam ε2rms , 95.5% of beam Slice emittance important for free electron lasers ! x slice A slice B z x’ x’ εΑ x εΒ x Emittance is only constant in beamlines without acceleration x’ Px ε1 x1’ x P1 acceleration ε 2 = ε1 P1 P2 P = mβ rel γ rel c with x’ ε2 Px x2’ x P2 normalised emittance ε N = β rel γ rel ε To distinguish from normalised emittance εN ,ε preserved with acceleration ! is quoted as “geometric emittance” ! Commonly used units for emittance mm·mrad, m·rad, μm, m, nm 1 mm·mrad=10-6 m·rad=1μm=10-6 m=103nm Often a π is added to the unit to indicate that the numerical value describes a surface in x, x’ space divided by π, i.e. 1 π·mm·mrad The units for normalised emittance are the same as for geometric emittance Due to the various definitions it is recommended to always mention the emittance definition used when reporting measurement values ! Emittance, why measuring it ? The emittance tells if a beam fits in the vacuum chamber or not w( z) = β ( z) ε < a(z ) LHC IR region aperture a(z) 10 × β y (z ) ε y Emittance is one of key parameters for overall performance of an accelerator o Luminosity of colliders for particle physics o Brightness of synchrotron radiation sources o Wavelength range of free electron lasers o Resolution of fixed target experiments Therefore emittance measurement is essential to guide tune-up of accelerator ! Measurement of emittance is closely linked with measurement of Twiss parameter β, α, γ . o Provide initial beam conditions for a beamline, thus allowing to compute optimum setting of focusing magnets in a beamline. Important to minimise beam losses in transfer line ! o Measurement of Twiss parameters at injection in synchrotron or storage ring allows to “match” Twiss parameters to circulating beam. This helps to minimise injection losses and to avoid emittance growth due to filamentation of unmatched beam. o Measurement of emittance as function of time in synchrotrons and storage rings allows to identify, understand and possibly mitigate mechanism of emittance growth. o Measurement of emittance at different locations in a beam line or in a linear accelerator allows to verify and/or improve beam optics model of this line. Moreover, it allows to identify, understand and possibly mitigate mechanism of emittance growth. Emittance, how to measure it ? ¾ Methods based on transverse beam profile measurements ¾ Slit and pepperpot methods ¾ Methods based on Schottky signal analysis ⇒ F. Caspers Lecture, June 3rd ¾ Direct methods to measure transverse profiles and beam divergence ⇒ see literature list Emittance measurement in transfer line or linac Twiss parameter β,α,γ are a priori not known, they have to be determined together with ε. Method A wC x wA wB La Reference point where β, α, γ will be determined ⇒ 2 Lc profile monitors see Enrico Bravin’s lecture w = c β ε − 2 c s α ε + s γ ε , for drift 2 z Lb 2 w 2 = β ε − 2 L α ε + L2 γ ε ⎛c ⎜⎜ ⎝ c' s ⎞ ⎛1 L⎞ ⎟=⎜ ⎟ s' ⎟⎠ ⎜⎝ 0 1 ⎟⎠ Derivation of emittance and Twiss parameters from beam width measurements w A2 = β ε − 2 L A α ε + L2A γ ε wB2 = β ε − 2 LB α ε + L2B γ ε wC2 = β ε − 2 LC α ε + L2C γ ε ⇓ can be rewritten in Matrix notation ⎛ w A2 ⎞ ⎛1 − 2 L A ⎜ 2⎟ ⎜ ⎜ w B ⎟ = ⎜1 − 2 L B ⎜ w 2 ⎟ ⎜1 − 2 L C ⎝ C⎠ ⎝ ⎛1 − 2 L A L2A ⎞ ⎛ βε ⎞ ⎟ ⎜ ⎜ ⎟ 2 LB ⎟ ⋅ ⎜ αε ⎟ ⇒ ⎜1 − 2 LB ⎜1 − 2 L L2C ⎟⎠ ⎜⎝ γε ⎟⎠ C ⎝ βε ⋅ γε − (αε ) 2 = ε 2 (β ⋅ γ − α 2 ) = ε 2 ⇒ −1 L2A ⎞ ⎛ w A2 ⎞ ⎛ βε ⎞ ⎟ ⎜ 2⎟ ⎜ ⎟ 2 LB ⎟ ⋅ ⎜ wB ⎟ = ⎜ αε ⎟ L2C ⎟⎠ ⎜⎝ wC2 ⎟⎠ ⎜⎝ γε ⎟⎠ βε ⋅ γε − (αε ) 2 = ε , β = βε αε , α= ε ε Emittance measurements often require inversion of 3x3 Matrices. Many Math and spreadsheet programs and programming languages have functions for this. If you insist to code it yourself you can use : The inverse of a 3x3 matrix: | a11 a12 a13 |-1 | a21 a22 a23 | | a31 a32 a33 | with DET = = | a33a22-a32a23 1/DET * | a31a23-a33a21 | a32a21-a31a22 a32a13-a33a12 a33a11-a31a13 a32a11-a31a12 a23a12-a22a13 | a21a13-a23a11 | a22a11-a21a12 | a11(a33a22-a32a23)-a21(a33a12-a32a13)+a31(a23a12-a22a13) Emittance measurement in transfer line or linac, Method B Adjustable magnetic lens with settings A,B,C (quadrupole magnet, solenoid, system of quadrupole magnets…) wA, wB, wC x z Reference point where β, α, γ will be determined w = c β ε − 2 c s α ε + s γ ε, 2 2 2 profile monitor ⎛c ⎜⎜ ⎝ c' s ⎞ ⎛ 1 L ⎞ ⎛ m11 ( I mag ) m12 ( I mag ) ⎞ ⎟ ⎟⎟ = ⎜⎜ ⎟⎟ ⋅ ⎜⎜ ⎟ ( ) ( ) m I m I 0 1 s' ⎠ ⎝ 22 mag ⎠ ⎠ ⎝ 21 mag Derivation of emittance and Twiss parameters from beam width measurements w A2 = c A2 β ε − 2 c A s A α ε + s A2 γ ε wB2 = c B2 β ε − 2 c B s B α ε + s B2 γ ε wC2 = cC2 β ε − 2 cC sC α ε + sC2 γ ε ⇓ can be rewritten in Matrix notation ⎛ w A2 ⎞ ⎛ c A2 ⎜ 2⎟ ⎜ 2 ⎜ wB ⎟ = ⎜ c B ⎜ w2 ⎟ ⎜ c 2 ⎝ C⎠ ⎝ C − 2c A s A − 2c B s B − 2c C s C ⎛ c A2 s A2 ⎞ ⎛ βε ⎞ ⎟ ⎜ ⎟ ⎜ 2 2 s B ⎟ ⋅ ⎜ αε ⎟ ⇒ ⎜ c B ⎜c2 sC2 ⎟⎠ ⎜⎝ γε ⎟⎠ ⎝ C βε ⋅ γε − (αε ) 2 = ε 2 (β ⋅ γ − α 2 ) = ε 2 ⇒ − 2c A s A − 2c B s B − 2cC sC −1 s A2 ⎞ ⎛ w A2 ⎞ ⎛ βε ⎞ ⎟ ⎜ 2⎟ ⎜ ⎟ 2 s B ⎟ ⋅ ⎜ wB ⎟ = ⎜ αε ⎟ sC2 ⎟⎠ ⎜⎝ wC2 ⎟⎠ ⎜⎝ γε ⎟⎠ βε ⋅ γε − (αε ) 2 = ε , β = βε αε , α= ε ε To determine ε, β, α at a reference point in a beamline one needs at least three w measurements with different transfer matrices between the reference point and the w measurements location. Different transfer matrices can be achieved with different profile monitor locations, different focusing magnet settings or combinations of both. Once β, α at one reference point is determined the values of β, in the beamline can be calculated. α at every point Three w measurements are in principle enough to determine ε, β, α In practice better results are obtained with more measurements. However, with more than three measurements the problem is over-determined. χ2 formalism gives the best estimate of ε, for a set of n measurements wi , i=1-n β, α with transfer matrix elements ci, si . χ2 formalism to determine ε, β, α Measured half beam width wi Predicted half beam width These conditions can be rewritten in matrix notation ci2 βε − 2ci siαε + si2 γε , ⎛ n 4 ⎜ ∑ ci ⎜ i =1 ⎜ n 3 ⎜ ∑ ci s i ⎜ in=1 ⎜ c2s2 ⎜∑ i i ⎝ i =1 but βε , αε , γε a priori not known Find set of βε , αε , γε values, which minimises n ( χ 2 = ∑ ci2 βε − 2ci siαε + si2 γε − wi 2 i =1 ) 2 Conditions for χ 2 minimum n ∂χ 2 = 0 ⇒ βε ∑ ci4 ∂βε i =1 n n n i =1 i =1 i =1 − 2αε ∑ ci3 si + γε ∑ ci2 si2 = ∑ ci2 wi 2 n n n n ∂χ 2 2 = 0 ⇒ βε ∑ ci3 si − 2αε ∑ ci2 si2 + γε ∑ ci si3 = ∑ ci si wi ∂αε i =1 i =1 i =1 i =1 n n n ∂χ 2 2 2 3 = 0 ⇒ βε ∑ ci si − 2αε ∑ ci si + γε ∑ si4 ∂γε i =1 i =1 i =1 n = ∑ c wi i =1 2 i n − 2 ∑ ci3 s i i =1 n − 2 ∑ ci2 s i2 i =1 n − 2 ∑ ci s i3 i =1 ⎛ n 4 ⎛ βε ⎞ ⎜ ∑ ci ⎜ ⎟ ⎜ i =1 ,⎜ ⎟ ⎜ n ⎜ αε ⎟ = ⎜ ∑ ci3 si ⎜ ⎟ ⎜ in=1 ⎜⎜ ⎟⎟ ⎜ c2s2 ⎜∑ i i ⎝ γε ⎠ ⎝ i =1 ⎛ n 2 2 ⎞ 2 2 ⎞ βε ⎛ ⎞ c s ⎟ ⎜ ∑ ci wi ⎟ ∑ i i i =1 ⎟ ⎜ ⎟ ⎜ i =1 ⎟ n n ⎜ ⎟ ⎟ ⎜ 2⎟ ci s i3 ⎟ ⋅ ⎜ αε ⎟ = ⎜ ∑ ci s i wi ⎟ ∑ i =1 ⎟ ⎜ ⎟ ⎜ i =n1 ⎟ n ⎜ ⎟ 2 4 2 ⎟ ⎜ ⎟ s i ⎟ ⎜⎝ γε ⎟⎠ ∑ ⎜ ∑ ci wi ⎟ i =1 ⎠ ⎝ i =1 ⎠ n n − 2 ∑c s i =1 n 3 i i − 2 ∑ ci2 s i2 i =1 n − 2 ∑ ci s i3 i =1 −1 ⎞ ⎛ n 2 2 ⎞ c s ⎟ ⎜ ∑ ci wi ⎟ ∑ i =1 ⎟ ⎜ i =1 ⎟ n n ⎟ ⎜ 2⎟ ci s i3 ⎟ ⋅ ⎜ ∑ ci s i wi ⎟ ∑ i =1 ⎟ ⎜ i =n1 ⎟ n 2 ⎟ 4 2 ⎟ ⎜ s i ⎟ ⎜ ∑ ci wi ⎟ ∑ i =1 ⎠ ⎝ i =1 ⎠ n 2 2 i i 2 βε ⋅ γε − (αε ) 2 = ε , β = βε αε , α= ε ε Emittance measurement insertion in CTF3 linac 4.5 m quadrupole triplet steering magnet OTR screen beam direction Girder 10 4 April 2007 Example of ε measurement in CTF3 linac g Emittance measurement with moveable slit x’ v/L Intensity at u, x’ in x, x’-space is mapped to position u+x’·L on screen u x x u v g z L Moveable slit profile monitor From width and position of slit image mean beam angle and divergence of slice at position u is readily computed. By moving slit across the beam complete distribution in x, Conditions for good resolution: v >> s x’ space is reconstructed. Phase space reconstruction at SPARC courtesy of Massimo Ferrario / LNF X’ X Single shot emittance measurement for 50 MeV proton beam at LINAC II / CERN SEM grid profile monitor quadrupoles for point to parallel imaging Slit fast deflector magnets position on profile monitor Single shot emittance measurement for 50 MeV proton beam at LINAC II / CERN time time resolved profile monitor quadrupoles for point to parallel imaging fast sweeping magnet slit (fixed position) beam Pepperpot similar to moving slit method + allows measurement in both planes simultaneously - pepperpot dimensions have to be well adapted to beam conditions hole spacing << beam widths hole image >> hole diameter hole image < hole spacing Where to use what ? quadrupole scan for beamlines where linear beam optics is valid, i.e. where space charge forces are small and energy spread is not too large Slit / pepper-pot for low energy beams, where beam can be stopped in slit / pepperpot mask high energy high space charge forces large energy spread slit / pepperpot ‐ + + quadrupole scan + ‐ ‐ drift with several monitors + ‐ + The "ultimate" emittance measurement set-up online data acquisition and analysis system profile monitor with variable Z-position (CCD camera & screen) beam switchable lens f=25-100 mm pepperpot beam generation Slice emittance measurement ATF at BNL time slice off crest acceleration Slice emittance set-up at FLASH / DESY deflecting RF cavity Emittance measurement in storage ring or synchrotron Beam profile measurement at one location of ring is sufficient to determine ε ⎛c s⎞ ⎟⎟ M ( z , z + C ) = ⎜⎜ ⎝ c' s' ⎠ is single particle transfer matrix for one ring revolution starting at profile monitor positon z. M ( z , z + C ) can be calculated from magnet parameters and position. Twiss functions must be periodic w ith Circumfere nce ⇒ ⎛ β ( z) ⎞ ⎜α ( z) ⎟ ⎜ ⎟ ⎜ γ ( z) ⎟ ⎝ ⎠ ⎛ c2 s 2 ⎞ ⎛ β ( z) ⎞ − 2c s ⎛ β (z + C)⎞ ⎟ ⎜ ⎜ ⎟ ⎜ ⎟ = ⎜ α ( z + C ) ⎟ = ⎜ − c c' c s '+ c' s − s s ' ⎟ ⋅ ⎜ α ( z ) ⎟ ⎜ ⎟ ⎜γ (z + C) ⎟ ⎜ c' 2 s ' 2 ⎟⎠ ⎝ γ ( z ) ⎠ − 2c ' s ' ⎝ ⎠ ⎝ ⎛ c2 s2 ⎞ − 2c s ⎛ β ( z) ⎞ ⎟ ⎜ ⎜ ⎟ Therefore ⎜ α ( z ) ⎟ is Eigenvecto r of matrix ⎜ − c c' c s '+ c' s − s s ' ⎟ . ⎜ γ ( z) ⎟ ⎟ ⎜ c' 2 s' 2 ⎠ − 2c ' s ' ⎝ ⎠ ⎝ 2s Solving for the Eigenvecto r gives β ( z ) = ( 2 − c − s ' )(2 + c + s ' ) Measured beam halfwidth w = β ( z) ε w2 ⇒ ε= β ( z) Complication in storage ring w( z ) = β ( z ) ε + D( z ) ΔP P 2 2 Emittance determination requires profile monitors at location with β (z ) ε >> D( z ) 2 ΔP P 2 For measurement of β(z) and D(z) see Jörg Wenniger’s lecture. For measurement of ΔP P see Mario Ferianis’s lecture Longitudinal emittance εL = z ΔP P 2 2 ΔP − z⋅ P In synchrotron or storage rings with Qs << 1 εL = ΔP P z2 2 If intensity dependend synchrotron tune shift is negligible it is sufficient z to measure either using I z 2 2 or ΔP P 2 ⎛ 1 ⎞ c ⎜⎜ α − 2 ⎟⎟ γ ⎠ = ⎝ ωS and the synchrotron oscillation frequency ωs ΔP P 2 Longitudinal emittance measurement for Linacs I Spectrometer magnet Y-plane deflection beam For good accuracy ( A L ω wt ) 2 >> βε X RF deflector cavity X-plane deflection ( D w ΔP ) 2 >> βε Y P required X-Y image monitor x’ y A wY bunch centered on zero cresting deflection t x w ΔP P wX x = A L sin (ωt ) wt ≈ 1 wx A Lω ΔP P 1 = wY DY y = DY Longitudinal emittance measurement for Linacs II Spectrometer magnet Y-plane deflection beam Profile monitor with preservation of time information like OTR or Cerenkov radiator + observation with streak camera y x w ΔP P wt streak direction ΔP P 1 wY = DY y = DY wY Pitfalls with emittance measurements 0 Beam width determination 0 Space charge 0 Chromatic effects 0 Calibration errors
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