Chapter 2 Basic MOS Device Physics Department of Microelectronics, School of Electronics & Information Eng. Xi’an Jiaotong Univ. Hong Zhang (张 鸿) Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 1 Outline • • • • General consideration MOS I/V characteristics MOS small signal model Second-order effects Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 2 Outline • General consideration – MOS physical structure – MOS symbols • MOS I/V characteristics • MOS small signal model • Second-order effects Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 3 MOSFET Structure A NMOS transistor on a p-type substrate ( or p “body”) W design parameters: Ldrawn : length W: width Process parameters: tox : thickness of oxide Nsub: doping concentration of sub Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 4 Substrate potential • Sub potential influences MOS characteristics • MOS is essentially a 4-terminal device – G: gate – S: Source – D: drain – B: body Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 5 Obtain NMOS and PMOS on a p-sub • Use N-well to fabricate PMOS • We call this double-well CMOS process – Question: if we have 2 NMOS on this wafer, can we connect the B terminals of them to different potentials? Why? – The same question for PMOS. Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 6 MOS symbols Sub potentials must be considered for analog IC 4-termial symbols are often adopted Design of Analog CMOS Integrated Circuits In digital IC: NMOS BGND PMOS BVDD Adopt 3-terminal symbols --Ch.2 Basic MOS Device Physics # 7 MOS as a switch • MOS transistor can be thought as a switch – Digital IC – Control transistors in analog IC – Question: how to turn on (or off) the MOS ? • Need to know the threshold voltage (Vth) Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 8 MOS as a VCCS • MOS is also a voltage controlled current source (VCCS) – In analog circuit – Question: how dose the gate voltage control the drain/source current? • Need to derive the I/V characteristics Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 9 Outline • General consideration • MOS I/V characteristics – Threshold Voltage – I/V characteristics derivation • MOS small signal model • Second-order effects Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 10 Turn-on process for a NMOS When VG=0, MOS is off, no current VG increases a bit,surface is depleted. Still off, still no current. Width of depletion region and surface potential increases with VG, The structure resembles two caps in series. Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 11 When VG increases to a sufficiently positive value, the surface is “inverted”, the MOS is turned on. The value of VG at this point is called VTH If VG rises further, the charge density in channel continues to increase (ID increases). Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 12 Threshold Voltage Definition • VTH: the gate voltage when the surface is inverted • Inversion definition: electron concentration in the channel equals to the hole concentration in substrate VTH MS 2 F Qdep Cox MS: Work function difference between the gate and substrate F :Fermi potential Qdep : Charge in the depletion region Cox:Gate oxide capacitance per unit area See Chapter 8, “Semiconductor Physics” for detail derivation Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 13 Important note about VTH VTH MS 2 F F ( kT / q ) ln( N sub / ni ) Qdep Cox Qdep 4q si | F | N sub For NMOS: the higher the substrate doping, the higher the VTH For a given process under given temperature, VTH is almost a constant. Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 14 Outline • General consideration • MOS I/V characteristics – Threshold Voltage – I/V characteristics derivation • MOS small signal model • Second-order effects Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 15 Derivation of I/V Characteristics VGS>VTH, inverted, but VD=VS, no current flows VD>VS, current flows from D to S How to obtain functions between IDS and terminal voltages? Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 16 Derivation of I/V Characteristics 1st observation: Charge density along the current direction is Qd (C/m) Charge velocity is v (m/s) I Qd v Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 17 • Second observation – Assume VGS>VTH, and S and D are all connected to ground, – Uniform charge density is obtained Qd WC ox (VGS VTH ) Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 18 • Then suppose VD is a little bit larger than VS • Charge density is no longer distributed uniformly, but a function of position x Qd ( x) WCOX [VGS V ( x) VTH ] Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 19 Qd ( x) WCOX [VGS V ( x) VTH ] I D Qd v WCox [VGS V ( x) VTH ] v dV ( x) Given n E , E ( x) dx dV ( x) I D WCox [VGS V ( x) VTH ] n dx Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 20 dV ( x) I D WCox [VGS V ( x) VTH ] n dx • Considering boundary conditions: V(0)=0, V(L) =VDS • Multiplying both sides with dx, and perform integration L VDS x 0 I D dx WCox n [VGS V ( x) VTH ]dV V 0 W 1 2 I D n Cox [(VGS VTH )VDS VDS ] L 2 Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 21 More simple method I D Qd v • Use average Qd (at L/2), and average electrical field I D WCox [VGS V ( x) x L / 2 VTH ] n E VDS 1 WCox (VGS VDS VTH ) n L 2 W 1 2 nCox [(VGS VTH )VDS VDS ] L 2 Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 22 I/V Characteristics in “triode region” 2 VDS W I D nCox [(VGS VTH )VDS ], for VDS (VGS VTH ) L 2 If VDS≤VGS-VTH , we define: NMOS operates in “triode region” or “linear region” In triode region: ID is influenced both by VGS and VDS W/L is called “aspect ratio”, a design parameter nCox is a process parameter Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 23 I/V Characteristics in “triode region” 2 DS V W I D nCox [(VGS VTH )VDS ], for VDS (VGS VTH ) L 2 I D,max 1 W nCox [(VGS VTH )2 ], whenVDS VGS VTH 2 L Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 24 Application of NMOS in Triode Region W I D nCox (VGS VTH )VDS L 1 if VDS VGS VTH 2 VDS 1 Ron I D C W (V V ) n ox GS TH L Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 25 I/V Characteristics in Saturation Region Triode region • What happens if VDS > VGS-VTH ? • Will it follow the parabolic curve? Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 26 Operation in Saturation Region Recall that: Qd ( x) WCOX [VGS V ( x) VTH ] Qd(x) drops to 0, if V(x) approaches VGS –VTH So, if VDS is slightly greater than VGS –VTH, “pinch off” happens at x1 Pinch off point moves to left when VDS increases Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 27 Saturation Region (VDS >VGS-VTH) W 1 2 I D nCox [(VGS VTH )VDS VDS ] L 2 ' DS V VGS VTH , (pinch - off) 1 W 2 I D nCox (VGS VTH ) 2 L For long channel MOS, L L 1 W 2 I D nCox (VGS VTH ) for VDS VGS VTH 2 L Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 28 Saturation Region Linear region ID nCOX W 2 L (VGS VTH ) 2 ID is controlled by VGS, independent of VDS, “saturated” Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 29 Application of MOS in Saturation • Saturated MOS can be used as current source ID nCox W 2 L (VGS VTH ) 2 nCox W 2 L VOD2 VOD=VGS-VTH, is called “overdrive voltage” VOD VGS VTH 2I D nCox (W / L) Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 30 Operation region changes with VG • For NMOS, if VGS<VTH, it is in off state. • When VGS increases, it operates from saturation region to triode region. VG increases Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 31 NMOS I/V characteristics summary • Off:VGS - VT≤0 I DS 0 • Triode region:0<VDS≤VGS-VT I DS 2 DS V W n Cox [(VGS VTH )VDS ] L 2 • Saturation region:0<VGS-VT<VDS I DS nCox W 2 L (VGS VTH ) Design of Analog CMOS Integrated Circuits 2 --Ch.2 Basic MOS Device Physics # 32 Understanding On and off Design of Analog CMOS Integrated Circuits Triode and saturation --Ch.2 Basic MOS Device Physics # 33 Outline • General consideration • MOS I/V characteristics • MOS small signal model – Notations – Understanding the concept of small signal – Transconductance of MOS – Ideal small signal model of MOS • Second-order effects Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 34 Important notations • DC or bias quantities: Uppercase symbol with upper case subscript – DC quantities or bias voltage, currents – VGS, ID, VDS, VB • Small signal: Lowercase symbol with lower case subscript – Incremental change of currents or voltages – vgs, id, vds,…. • Transient quantities: Uppercase symbol with lower case subscript – Vgs=VGS+vgs Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 35 Explanation of notations VB t Bias vin ∞ Vin = ? Vin = VB + vin Signal t ∞ VB Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 36 DC or Bias analysis of a simple amplifier VDD RD VB Assume MOS operates in saturation region. VOUT mnCox W 2 ID = (VB -VTH ) 2 L VOUT = VDD - I D RD can we use “VOUT/VB” to denote gain of the amplifier? Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 37 Transient analysis Vin = VB + vin = VB + va sin(wt ) VDD vin=va t VB Vin=VB+vin Vout = VIN va Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 38 Quantitive analysis Vin = VB + vin = VB + va sin(wt ) mnCox W mnCox W 2 Id = (Vin -VTH ) = [(VB -VTH ) + va sin(wt )]2 2 L 2 L mnCox W W = I D + [mnCox (VB -VTH )]⋅ va sin(wt ) + ⋅ [va sin(wt )]2 L 2 L I d = I D + id id nonlinearity Vout = VDD - I d RD = (VDD - I D RD ) - id RD = VOUT - vout vout W = id RD = mnCox (VB -VTH )]⋅ RD ⋅ va sin(wt ) L Amplification factor Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 39 Transient response VDD Vin=VB+vin Vout = VOUT vout VOUT VOUT VB vout W mnCox (VIN -VT )]⋅ RD ⋅ va L vin = va sin(wt ) vout Amplification factor W = id RD = mnCox (VB -VTH )]⋅ RD ⋅ va sin(wt ) L Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 40 Small signal model vin = va sin(wt ) transconductance: gm vout W = -id RD = -[mnCox (VB -VTH )]⋅ vin ⋅ RD L • Problem:Can we analyze small signal directly? • Solution: Small signal equivalent model. • decomposition of the signal transfer process: gm RD vout=-gmvinRD id vin Convert to current Back to voltage Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 41 Basic small signal model vin gm Convert to current id RD Back to voltage vout=-gmvinRD Key point:How to calculate gm? Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 42 gm:Transconductance gm I D VGS V D S co n stan t Control capability of VGS on ID mnCox W (VGS -VTH ) 2 ID = 2 L gm W n C ox (V G S V T H ) L W 2 nCox I D gm µ I D L 2I D = VGS -VTH Design of Analog CMOS Integrated Circuits or gm µ I D ? --Ch.2 Basic MOS Device Physics # 43 Three elements for calculating gm • There are only two independent elements in W/L, ID, and VGS-VT • Any one can be derived from another two gm 2 n C ox W 2I D W I D nCox (VGS VTH ) = L VGS -VTH L Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 44 Outline • • • • General consideration MOS I/V characteristics MOS small signal model Second-order effects – Body effect – Channel length modulation – Sub-threshold conduction Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 45 Body Effect (1) What happens if VB ≠ VS? Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 46 Influence of body effect on MOS • Consider that VS=0, VB < 0 ─More holes are extracted from the surface to the body electrode ─Negative charge increases, depletion region wider. VB↓, Qd↑. Therefore, larger VGS is needed to obtain inversion at surface. VTH increases . We call this “body effect” or “backgate effect”. Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 47 Quantitive analysis of body effect on VTH Qdep 2qN sub si (2 F VSB ) Qdep 0 2qN sub si 2 F VTH MS 2 F Qdep MS 2 F VTH 0 Cox Qdep 0 Cox From Qdep0 to Qdep, VTH ↑ Qdep Qdep 0 Cox 2 F VSB 2 F 1 Cox 2q si N sub ─ is called body effect coefficient, and is provided by foundry. ─ For a 0.5um CMOS process, NMOS =0.4V1/2; PMOS =-0.4V1/2 Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 48 A example: influence of body effect on MOS circuit (a) The source-bulk voltage varies with input level; (b) input and output voltages with no body effect; (c) input and output voltages with body effect Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 49 Influence of body effect on small-signal model: gmb gmb:body transconductance — Control capability of body voltage on drain current g mb I D VT H W nC OX (V G S V T H )( ) V BS L V BS A lso , VT H VT H ( 2 F V SB ) 1 / 2 2 V BS V SB g mb g m 2 2 F V SB gm gmb / gm , typical value is 0.1~0.3 Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 50 Small-signal model with body effect VDD RD vout vin G D vin B G S vbs VBS D + vgs gmvgs gmbvbs - S vbs + B RD Body transconductance provides another freedom to control the drain current In N-well process, body of all NMOS is connected to ground. However, the body of PMOS can be used as a control terminal Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 51 Channel length modulation effect • A NMOS operated in saturation region with large enough length – ID is independent of VDS – MOS is an ideal current source – Infinite output resistance • Short channel MOS – ID is influenced by VDS – Finite output resistance • The influence of VDS on ID is called Channel length modulation effect Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 52 Quantitive analysis L' L L L 1 1 1 1 1 (1 ) L' L L L (1 L / L) L L assume L / L VDS , 1 / L' ID 1 (1 VDS ) L 1 W nCox (VGS VTH ) 2 (1 VDS ) 2 L Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 53 How to get ? VA VDS 1 I D1 VDS 2 VDS 1 I D 2 I D1 I D 2 I D1 1 VA I D1VDS 2 I D 2VDS 1 ID1 ID2 Early voltage -VA = 1 L 1 ( ) L VDS L Different with different L L=0.5m, ≈0.1V-1 L=1m , ≈0.05V-1 Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 54 Influence of on small-signal model • ID varies with VDS non-ideal current source • Finite output resistance ro ,or gds=1/ro ID nCOX W 2 L (VGS VTH ) 2 (1 VDS ) VDS 1 1 1 ro I DS I DS / VDS 1 C W (V V ) 2 I DS n OX GS TH L 2 Important note: MOS small-signal output resistance can be changed by adjusting bias current (ID), or transistor length Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 55 Small-signal model considering VDD RD vout vin D vin B G S vbs VSB Design of Analog CMOS Integrated Circuits G D + vgs gmvgs gmbvbs - S vbs + B ro RD --Ch.2 Basic MOS Device Physics # 56 Sub-threshold Conduction • “Weak inversion” for VGS< VTH • Current is not zero but exhibits exponential dependence on VGS • What is the influence of this effect on real IC? VGS I D I 0 exp , ( 1, VDS 200mV ) VT Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 57 MOS parasitic capacitance • C1:Oxide capacitance • C2:Depletion-layer capacitance • C3, C4 : Overlap capacitance – Overlap capacitance of unit width is Cov; • C5, C6: Junction capacitance, decomposed into Cj and Cjsw Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 58 Parasitic capacitance model • A capacitance is modeled between every two of the four terminals – CGS and CGD are more important Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 59 Elaborate layout design to reduce parasitic cap. “folded or “multi-finger” structure C DB CSB WEC j 2(W E )C jsw W W CDB EC j 2( E )C jsw 2 2 Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 60 • Multi-finger structure reduces parasitic resistance Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 61 CGS,CGD in different operation region Important note: CGS is much larger than CGD in saturation region Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 62 Complete MOS small-signal model CGD gmvgs vgs CGB CGS CSB gmbvbs ro CDB vbs CGB, CSB and CDB can be omitted for simplicity Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 63 summary • General consideration • MOS I/V characteristics – Threshold Voltage – I/V characteristics derivation • MOS small signal model – Notations – Understanding the concept of small signal – Transconductance of MOS – Ideal small signal model of MOS • Second-order effects – Body effect – Channel length modulation – Sub-threshold conduction – Complete small-signal model Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 64 Assignment -#1 • Problems: 2.5, 2.8, 2.16, 2.17, 2.18 • Hand in on next Thursday. Design of Analog CMOS Integrated Circuits --Ch.2 Basic MOS Device Physics # 65
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