Cryogenics 41 (2001) 725–731 www.elsevier.com/locate/cryogenics Description of removable sample mount apparatus for rapid thermal conductivity measurements A.L. Pope, B. Zawilski, T.M. Tritt * Clemson University, 118 Kinard Laboratory, Clemson, SC 29632-0978, USA Accepted 31 August 2001 Abstract Described in this paper is an apparatus in which bulk samples can easily be mounted on a removable puck for thermal conductivity measurements and then placed in the described measurement system. This rapid mounting and measurement system uses a standard steady-state absolute thermal conductivity measurement but allows for rapid measurement and excellent thermal stability coupled with the use of a closed cycle refrigerator. The distinction of this system is rapid mounting and measurement of thermal conductivity over a broad temperature range without sacrificing accuracy and precision in data acquisition. In addition, this system allows for versatility in its use. The design of this apparatus, measurement specifications, and thermal conductivity data on several standard materials measured in this system are presented. Ó 2002 Elsevier Science Ltd. All rights reserved. Keywords: Thermal conductivity; Closed cycle refrigerator; Rapid measurement 1. Introduction The determination of the thermal conductance ðKÞ is a solid-state measurement in which a temperature difference ðDT Þ across a sample is measured due to power input ðPR ¼ I 2 RÞ into a resistive heater, essentially a measure of the heat flow through the sample. Thermal conductivity ðkÞ is the same measurement with the dimensions of the sample taken into account and k ¼ KL=A, where L is the length between thermocouples, DT is the temperature difference measured, and A is the cross-sectional area of the sample through which the heat P flows. In the thermal conductivity measurement A P ¼ kTOT DT ; L where P is the power input into the sample, kTOT is the total thermal conductivity. Many methods exist for measuring thermal conductivity such as the 3x technique [1], thermal diffusivity, and the steady-state (absolute or comparative) technique [2]. Each technique has its own advantages and limitations. Our probe is designed to measure electrical * Corresponding author. Tel.: +1-864-656-5319; fax: +1-864-6560805. E-mail address: [email protected] (T.M. Tritt). conducting samples with approximate dimensions of 2 2 8 mm3 . It was determined that the absolute steady-state technique would be most advantageous to use for these samples. There are power loss terms ðPLOSS Þ involved in the measurement of thermal conductivity utilizing the steady-state technique that must be accounted for or minimized. Thus, one must determine the true power through the sample ðP ¼ PIN PLOSS Þ that is responsible for the temperature gradient. 2. Experimental considerations Previously we developed a custom designed apparatus for rapid thermopower and electrical resistivity measurements using dismountable integrated circuit chips incorporated into a commercial cryocooler [3]. Utilization of the absolute steady-state technique (as used in the dismountable puck system described here) requires thorough understanding of the errors or losses involved in this technique. A disadvantage to using an absolute technique is the difficulty in determining exactly how much heat is being lost; consequently, this loss must be minimized or calculated to reduce this uncertainty. This may be done through the use of small diameter wires with low thermal conductance, high vacuum to reduce convection and gas reduction loss and designs to reduce 0011-2275/02/$ - see front matter Ó 2002 Elsevier Science Ltd. All rights reserved. PII: S 0 0 1 1 - 2 2 7 5 ( 0 1 ) 0 0 1 4 0 - 0 726 A.L. Pope et al. / Cryogenics 41 (2001) 725–731 radiation losses. For example, in order to minimize conductive loss a differential thermocouple is utilized so that there will only be two wires available as a heat leak instead of four wires if standard thermocouples were used. The absolute technique requires fewer thermocouples and provides a smaller quantity of places to make poor thermal contacts than if a comparative technique was used. Radiative loss is also a major concern when using any solid-state technique to measure thermal conductivity. There are only a few design features that can be incorporated to overcome these losses and corrections to the data are typically necessary. Matching of the temperature gradient on a radiation shield surrounding the sample with the temperature gradient of the sample is often used as a solution in larger samples. With smaller samples, several mm in length, this correction shows little reduction of radiative loss. Another method to combat radiative loss with small samples is to incorporate a radiation shield that will reflect the heat back on the sample. This is accomplished through the use of a highly reflective surface on the inside of the radiation shield. Also essential when making measurements is an excellent vacuum which will minimize convection and heat conduction in the system. Convection will lead to heat transfer along the sample not associated with travel through the sample. A sweep of power verses DT conducted at a stable temperature should be linear. If it is not a straight line, there are losses due to convection which need to be corrected for or minimized. Another issue that must be taken into consideration when making thermal conductivity measurements is thermal sinking of the sample. In order to make an accurate measurement, the sample must be in excellent thermal contact with the cold finger and heater as well as with the thermocouple. Kopp and Slack [4] present an excellent discussion of thermal contacting problems with thermocouples. Uncertainties in measurement of sample dimension can also lead to a 5–10% uncertainty in the thermal conductivity measurement since the thermal conductivity depends on the cross-sectional area of the sample and the length between the thermocouples. With many systematic errors that must be considered, then a 5–10% uncertainty in the absolute magnitude of the thermal conductivity is generally considered to constitute a relatively accurate measurement. essential when designing this system was the ability to thermally sink the samples to the cold finger. This was achieved through the use of custom designed components at Clemson, coupled with the use of commercial parts (specifically a removable puck and puck receptacle, provided by Quantum Design) and incorporating these into a commercial cryocooler system. The commercial manufactured parts used here are also used in the Quantum Design physical properties measurement system (PPMS) to thermally sink experiments to the cold finger of the PPMS. The sample puck is made of oxygen-free high-conductivity copper that couples directly to the puck receptacle that houses the thermometer. The sample puck is keyed so that it may only be inserted into the receptacle in the correct orientation [5]. Another concern alleviated though the use of commercial parts was the effect of thermal cycling on the puck/ receptacle junction since this had been adequately tested previously. In order to facilitate rapid throughput of samples, the puck was designed to accommodate two samples, using an absolute steady-state technique. The two mounted samples can be measured simultaneously. Samples are mounted on the dismountable puck and tested for readiness (good electrical contact) in a custom designed test box before they are plugged into the closed cycle refrigerator. A good ‘‘rule of thumb’’ is that excellent electrical contact as well as mechanical stability is reflected into excellent thermal contact. Additionally, the dismountable puck allows all sample mountings to be performed under a microscope and ensures virtually no ‘‘down time’’ in the operation of the closed cycle refrigerator. Components necessary to thermally couple the puck receptacle to the cold finger were machined (see Fig. 1). A brass piece is screwed into the cold finger of the closed 3. Description of removable puck system With the desire to design for a system in which samples for thermal conductivity measurements could be easily introduced into the cold cycle refrigerator, several requirements were considered. The foremost concern when designing this system was the reproducibility and accuracy of the measurement. One requirement that was Fig. 1. Pieces necessary for assembling the thermal conductivity receptacle for the dismountable puck. These pieces are assembled on the cold finger of the closed cycle refrigerator. A.L. Pope et al. / Cryogenics 41 (2001) 725–731 cycle refrigerator. This brass piece is essential to slow down the cooling rate of the sample to prevent thermally shocking the sample. It also provides better temperature control for thermal cycling of the system and stabilizing at a desired temperature. The brass piece acts as a thermal decoupler, due to its low thermal conductivity (k 100 W/m K at T 300 K) and provides thermal inertia between the sample and the copper cold finger (k 400 W/m K at T 300 K). A small copper cup was designed and machined and is screwed into the brass piece. There is a small hole in the side of the copper cup through which the electrical lead wires can be inserted into its interior. The lead wires are thermally sunk to this Cu cup with thermally conductive epoxy, called Stycastâ . The wires run from the puck receptacle to the electrical outlet connectors in the closed cycle refrigerator. This Cu cup is necessary to electrically connect to the puck receptacle, which has its electrical lead pins at the bottom of the receptacle. The cup also acts as an isothermal environment for the wires leading to the puck receptacle, minimizing any unwanted or extraneous thermal voltages. In order to attain excellent thermal sinking, a copper ring was machined to fit snugly around the puck receptacle and securely in the copper cup. The copper ring is screwed to the puck receptacle. Twisted pair wires are thermally sunk with grease to the side of the copper cup and then attached to the leads on the puck receptacle. A Si diode is imbedded into the puck receptacle, providing excellent thermal coupling as well as placement close to the sample. The ring/receptacle assembly is placed in the copper cup using thermal grease to enhance thermal contacting. The copper cup and copper ring/receptacle are fastened together with countersunk screws securing the puck receptacle in place. This system provides a hardwired mount to plug the puck into without sacrificing the excellent thermal contact required for reliable thermal conductivity measurements. In addition, a Cu radiation shield (can) which has been polished on the inside and sputtered with high reflectivity Au is placed around the samples and thermally sunk to the base. See Fig. 2 for an assembly drawing. 4. Mounting configuration The Quantum Design puck is then modified to accommodate samples for the thermal conductivity measurement. A small copper plate with four screw holes is attached with Stycastâ to the thin copper film on the removable puck. Small copper blocks with screw holes to fasten to the copper block on the removable puck are machined with a hole in the center. This hole acts as a solder pot with which to thermally contact the sample to the cold finger. Stycastâ may also be used to thermally adhere the sample to the base. Samples are thermally 727 Fig. 2. Assembly drawing of removable thermal conductivity mounting system. sunk into the copper solder pots and subsequently attached to the modified removable puck from Quantum Design. Consequently, the sample is in excellent thermal contact with the puck, which in turn is thermally adjoined to the entire system. The next challenge in showing the viability of this dismountable mounting system is in attaining accurate and reproducible data by setting up an absolute thermal conductivity measurement on the removable puck (Fig. 3). The measurements were performed on a set of available standards. The sample mounting technique is taken from Uher [8]. In order to measure thermal conductivity using the absolute technique a strain gauge is employed as a resistive heater (120 X resistor). The strain gauges are used as heaters due to the fact that their small size allows for better thermal contact with the sample as well as less surface area for radiative loss. The strain gauges are attached to the sample with a very thin layer of 5 min epoxy providing very good thermal contact even though the thermal conductivity of the epoxy is low. The existing leads of the strain gauge (Cu, k 400 W/m K at 300 K) are removed and replaced with phosphor-bronze (k 20 W/m K at 300 K) wires due to their low thermal conductivity and consequently minimized heat loss. A two-wire resistance measurement is made from the sample to the puck and a four-wire measurement is made from the puck to the measurement 728 A.L. Pope et al. / Cryogenics 41 (2001) 725–731 Ω establishing a vacuum of 106 Torr in order to minimize convective losses. The sample chamber is then evacuated with a roughing pump and then a turbo pump (typical vacuum 106 torr). 5. Data acquisition Fig. 3. Two samples are mounted on a removable puck. Each sample is mounted as pictured above. equipment. This two-wire measurement introduces a small error (<1%) in the power input and thus the thermal conductivity, which must be and is corrected for in the calculation. Two #38 AWG (0.004 in.) insulated copper wire flags are placed parallel to one another and perpendicular to the length of the sample. Once the Stycastâ is dry, the coating on the tops of the copper wires are scraped to provide a surface on which the (0.001 in.)Cn–chromel junction of the differential thermocouple is soldered. This Cu–thermocouple junction provides excellent thermal contact. The copper flags help not only with thermal contact, but also ensure that the differential thermocouple is not shorted to the sample resulting in erroneous voltage measurements. This specific type of thermocouple was chosen due to its low thermal conductance, which will assist in reducing error due to conductive loss. A single differential thermocouple is used in this system instead of two thermocouples in an effort to further minimize conductive losses through the wires (2 wires lead away from the sample instead of 4). Once the sample has been examined to ensure all the wires are installed properly and none of the wires are electrically shorted, the puck is placed in the puck receptacle on the cold finger of the closed cycle refrigerator and three shields are placed over the sample. The inner shield matches the temperature gradient around the samples in an effort to minimize the radiative loss. The middle shield helps minimized radiation loss from the cold finger. The outermost shield is a vacuum shield, Thermal conductivity measurements are made using state-of-the-art electronics (measurement equipment described below) and data acquisition software. Using LabViewâ , a visual programming language, a custom designed data acquisition program is developed that automates the data acquisition process. The cross-sectional area of the samples, which have been measured using an optical microscope or a set of calipers, is entered into this program. The length between the thermocouples is measured from the inside edge of the two copper flags and entered into the program. Measurement from inside the wires is necessary because the copper wires are of much higher thermal conductivity than the samples that are being measured, generally two orders of magnitude. The copper wire essentially provides a thermal short across its small diameter. The LabViewâ program controls a Lakeshoreâ 340 temperature controller which allows stabilization of temperature to 50 mK. In fact, the program requires that the base temperature remain within 50 mK before data is acquired. Once the temperature is stable, a small power or current (depending on the temperature) is independently input into each strain gauge, 120 X resistors, by two Kepcoâ power supplies. The heat is input into the sample until the heat flow is uniform and stable, typically 2–3 min. The power and DT are recorded. The current through the heater is slightly increased, the temperature difference allowed to equilibrate, and then the power and DT are recorded using a Keithley 2001 multimeter. This sequence is repeated several times, resulting in a power verses DT sweep at a given temperature. This power sweep is then fit to a straight line, the slope being proportional to the thermal conductivity. This measurement is repeated at desired increments of temperature from 10 to 300 K. Both samples have independent power supplies attached to their respective heaters. A typical measurement sequence for the entire temperature range will take 24–48 h to run two samples on this apparatus. 6. Reproducibility and accuracy of data Data is taken in the thermal conductivity system while the apparatus is warming from 10 to 300 K. It is much easier to thermally stabilize the experiment in the warming mode than the cooling mode of the closed cycle refrigerator. Representative data can be seen in Fig. 4. A.L. Pope et al. / Cryogenics 41 (2001) 725–731 (a) 729 determined, being the difference between kT and kE ðkL ¼ kT kE ). The lattice contribution is usually observed to have a very characteristic shape, in this case the curve goes as 1=T from 80 to 150 K. Above 150 K, the curve deviates from this fit. When performing thermal conductivity measurements the sample temperature is given by ðT þ DT Þ and upon doing a Taylor expansion 4 4 of ½ðTSAM Þ ðTSURR Þ the radiation loss to first order is found to be proportional to T 3 DT . Consequently, the radiation loss is proportional to T 3 as a function of overall temperature. If a curve of the measured lattice thermal conductivity kL is plotted in conjunction with the extrapolated lattice ðkLC ¼ Að1=T Þ, where A ¼ constant) and the difference between the two is called D (where D ¼ kL kLC ), it is observed that near room temperature the difference in the calculated and assumed lattice thermal conductivity is on the order of 1 W/m K (Fig. 4(b)). The difference, D, is assumed to be due to radiation loss proportional to T 3 . If D is plotted verses T 3 , since there is a temperature dependence of the thermal conductivity, it is seen (see inset in Fig. 4(b)) that the relationship is linear, indicating that the difference is indeed due to radiative losses. The total thermal conductivity corrected for radiative losses can be determined by adding the calculated electronic thermal conductivity and the corrected lattice thermal conductivity together. Using this iterative process, corrections for radiative losses can be achieved. The true test of any measurement technique’s viability comes through the accuracy and reproducibility of the measured data. In Fig. 5, thermal conductivity from NIST 1461 standard stainless steel is shown with the corresponding data taken in the system described above. (b) Fig. 4. (a) Total measured thermal conductivity with electronic and lattice contributions shown. The electronic thermal conductivity ðkE ) can be extracted using the Wiedemann–Franz Law. (b) Lattice thermal conductivity ðkL ) is extracted and subtracted from the total thermal conductivity ðkTOT Þ. A radiation term ðDÞ can then be determined as described in the text. One of the drawbacks to using a standard steady-state method is that above 150 K radiation loss can become a serious problem. For larger samples (1–2 sq in.), the radiation effects are typically negligible below 150 K. These large samples are usually very difficult to obtain in research grade samples. Thus, in order to correct for radiation effects in our smaller samples the following procedure is employed. Once the thermal conductivity (kT ) is measured, the Wiedemann–Franz law ðkE ¼ L0 rT ; where L0 is the Lorentz number, r is the electrical conductivity and T is the temperature) is used to extract the electronic contribution (kE ) to the thermal conductivity. From this the lattice contribution (kL ) is Fig. 5. Thermal conductivity of stainless steel as measured in the closed cycle refrigerator with no corrections compared to NIST 1461 Stainless Steel standard data for stainless steel. 730 A.L. Pope et al. / Cryogenics 41 (2001) 725–731 With corrections made for radiative loss and conduction along the wires we conclude that our data is accurate to within 6% of the NIST data. However, the temperature dependence is identical. Much of the difference in magnitude is due to uncertainty in the measurement of the sample dimensions as well as conductive and convective losses, which may be estimated and corrected for. Low thermal conductivity samples will give off a smaller signal, so care must be taken to get a very low noise level from the thermocouples. The thermal conductivity measurement is found to be very accurate, with essentially the same temperature dependence and magnitude of the stainless steel standard. However, precision and reproducibility of the measurement are also very important. In order to check these issues, four AlCuFe quasicrystalline samples were cut from the same boule. These samples were all mounted for thermal conductivity measurements, dimensions were ascertained, and thermal conductivity recorded. In Fig. 6(a), thermal conductivity of the four samples is shown. The data are all within 10% of one another. This variability is probably due to dimensional uncertainties as well as possible slight variation in sample composition between the samples measured. If the data are normalized (Fig. 6(b)), it is seen that the curves lie on top of one another. The slight deviation at higher temperatures is most likely due to differences in sample size leading to different amounts of radiation contributions. This data shows that our system has very good precision and reproducibility. In addition, our quasicrystalline data show an excellent agreement with the values in the literature [6]. 7. Conclusions (a) (b) In conclusion, a custom designed measurement system in which thermal conductivity can be measured accurately and precisely using a dismountable mounting system has been developed. This system utilizes an absolute thermal conductivity technique, but has the advantage that two samples are mounted on a puck that is easily introduced into a closed cycle refrigerator. This system offers enhanced throughput of samples and ease of mounting. One added advantage to this system is its versatility in the type of measurement to be executed on the dismountable puck. For example, a system has also been developed to measure thermal conductivity of very thin fibers (A 0:0001 to 0:01 mm2 ) using a modification of this design and incorporating with an extensive data acquisition program [7]. This parallel thermal conductivity (PTC) technique measures a background thermal conductance of the wire heaters and platform and then the sample is placed in parallel with the background and measured again. By subtracting the background the thermal conductance of the sample may be determined. Acknowledgements Fig. 6. Thermal conductivity of four AlCuFe samples cut from the same boule and measured in the dismountable puck system. (a) As measured data and are the same to within 10% or roughly the error in measuring the dimensions of the sample. (b) Normalized data are shown to behave the same with a slight variation at higher temperature due to radiation from the sample. We acknowledge Matt Marone for his work on the first generation of this thermal conductivity system. Michael Kaeser measured thermal conductivity data for Fig. 4 in this paper. Thanks are due to Roy Littleton IV for his help in modifying the experimental setup for better temperature control. We would like to thank Ian Fisher, Paul Canfield, and Cynthia Jenks at Ames National Lab for providing us with the AlCuFe samples presented in this paper. A special thanks to Ctirad Uher for useful ideas and discussion on mounting samples for thermal conductivity measurements. We would also like A.L. Pope et al. / Cryogenics 41 (2001) 725–731 to thank Quantum Design for providing the parts and support necessary to design this system. We acknowledge support from ONR, ARO, DARPA (ONR No. N0001498-0271, ONR/DARPA No. N00014-98-0444, and ARO/DARPA No. DAAG55-97-0-0267) and from research funds provided (TMT) from Clemson University. References [1] Cahill DG. Rev Sci Instrum 1990;61:802. [2] Parrott JE, Stuckes AD. Thermal conductivity of solids. London: Pion; 1975. 731 [3] Pope AL, Littleton IV RT, Tritt TM. Apparatus for the rapid measurement of electrical transport properties for both ‘‘needlelike’’ and bulk materials. Rev Sci Instrum 2001;72:3129. [4] Kopp J, Slack GA. Thermal contact problems in low temperature thermocouple thermometry. Cryogenics February, 1971. [5] Physical Properties Measurement System: Hardware and Operation Manual. Quantum Design Corporate Headquarters, 11578 Sorrento Valley Road, San Diego, CA 92121, USA. [6] Perrot A, Duboise JM, Cassart M, Issi JP. In: Proceeding of the 6th International Conference on Quasicrystals, 1997. p. 588. [7] Zawilski BM, Littleton IV RT, Tritt TM. Rev Sci Instrum 2001;72:1770. [8] Uher C. private communication.
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