Large-Sample Confidence Intervals Large-Sample Confidence Intervals Proposition If n is sufficiently large, the standardized variable Z= X −µ √ S/ n has approximately a standard normal distribution. This implies that s x¯ ± zα/2 · √ n is a large-sample confidence interval for µ with confidence level approximately 100(1 − α)%. This formula is valid regardless of the shape of the population distribution. Large-Sample Confidence Intervals Large-Sample Confidence Intervals Example (a variant of Problem 16) The charge-to-tap time (min) for a carbon steel in one type of open hearth furnace was determined for each heat in a sample of size 46, resulting in a sample mean time of 382.1 and a sample standard deviation of 31.5. Calculate a 95% confidence interval for true average charge-to-tap time. Large-Sample Confidence Intervals Large-Sample Confidence Intervals Example (Problem 19) The article “Limited Yield Estimation for Visual Defect Sources” (IEEE Trans. on Semiconductor Manuf., 1997: 17-23) reported that, in a study of a particular wafer inspection process, 356 dies were examined by an inspection probe and 201 of these passed the probe. Assuming a stable process, calculate a 95% confidence interval for the proportion of all dies that pass the probe. Large-Sample Confidence Intervals Large-Sample Confidence Intervals Proposition A confidence interval for a population proportion p with confidence level approximately 100(1 − α)% has r pˆ + lower confidence limit = 2 zα/2 2n p ˆq ˆ n − zα/2 + 2 zα/2 4n2 2 )/n 1 + (zα/2 and pˆ + upper confidence limit = 2 zα/2 2n r + zα/2 p ˆq ˆ n 2 )/n 1 + (zα/2 + 2 zα/2 4n2 Large-Sample Confidence Intervals Large-Sample Confidence Intervals Example (Problem 16) The charge-to-tap time (min) for a carbon steel in one type of open hearth furnace was determined for each heat in a sample of size 46, resulting in a sample mean time of 382.1 and a sample standard deviation of 31.5. Calculate a 95% upper confidence bound for true average charge-to-tap time. Large-Sample Confidence Intervals Large-Sample Confidence Intervals Example (Problem 19) The article “Limited Yield Estimation for Visual Defect Sources” (IEEE Trans. on Semiconductor Manuf., 1997: 17-23) reported that, in a study of a particular wafer inspection process, 356 dies were examined by an inspection probe and 201 of these passed the probe. Assuming a stable process, calculate a 95% lower confidence bound for the proportion of all dies that pass the probe. Large-Sample Confidence Intervals Large-Sample Confidence Intervals Proposition A large-sample upper confidence bound for µ is s µ < x¯ + zα · √ n and a large-sample lower confidence bound for µ is s µ > x¯ − zα · √ n A one-sided confidence bound for p results from replacing zα/2 by zα and ± by either + or − in the CI formula for p. In all cases the confidence level is approximately 100(1 − α)%
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