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तपमीपी‍समंतत‍ईटी‍19
........................................................................................................................................................
ईटी
19/ टी-24, टी-25
26-11-2014
................................................
रेषती :
1. ईटी
19 के सभी सद्य
2. वि्युत तकनीकी विभाग परिषद के सभी सद्य ताा
3. ूचि िखने िाले अ्य सभी िनकाय
मह दय,
कृ्या िन‍नललखखत मस दे संल्न ह :
रलेख
ईटी 19 (6809)
ईटी 19 (6810)
शीषषक
ˆ““Ö ि ट्ता आिेग
पिीषण के मापन
हे तु रयु्त
उपकिणं हे तु अपेषाऍ ं [IEC 61083-1 : 2001]
उ्ि ि ट्ता एिं उ्ि किं ट पिीषणं मं मापन हे तु
उपकिणं एिं सॉ्टिेयि -भाग १
रय्
ु त उपकिण एिं सॉ्टिेयि -
भाग २: आिेग ि ट्ता एिं किं ट िाले पिीषणं हे तु सॉ्टिेयिं की अपेषाऍ ं [IEC 61083-2 :
2013]
कृ्या इन मस दं का अिल कन किं औि अपनी स‍मितयॉ ं यह बताते हुए भेजं कक अंतत: यदद ये मानक
के ूप मे रकालशत ह जाऍ ं त इन पि अमल किने मं आपके ्यिसाय अािा काि बाि मं ्या
कदिनाइयॉ ं आ सकती हं ।
स‍मितयॉ ं भेजने की अंितम तािीख:
15-01-2015
स‍मितयॉ ं यदद क ई ह त कृ्या अगले प‍ृ ि पि ददए प
दं ।
मं अो ह्ताषिी क उपरिललखखत पते पि भेज
यदद क ई स‍मित रा्त नहीं ह ती अािा स‍मित मं केिल भाषा संबंोी
दु ट हुई त उपि ्त रलेखं क
यााित अितंम ूप ददया जाएगा । यदद क ई स‍मित तकनीकी रकृित की हुई त विषय सलमित के
अ्यष के पिामशष से अािा उनकी इ् ा पि
बाद रलेखं क अंितम ूप दे ददया जाएगा 1।
आगे की कायषिाही के ललए विषय सलमित क भेजे जाने के
कृपया न ट किं कक मस दे की तकनीकी विषय ि्तु क
संल््नत नहीं ककया गया ह ्यंकक ये मस दे
आई. ई. सी. मानकं के समूप हं । वि्तत
ृ ‍य िे के ललए कृपया संबंचोत िा‍रीय रा्कान मं उ्टलखखत
आई. ई. सी. रकाशन पढं अािा अो ह्ताषरित क संपकष किं ।
ोन‍यिाद,
भिदीय,
(मदहम‍जन)
।िञािनक‍एफ‍एिं‍रमख
ु ‍ (वि्यत
ु ‍तकनीकी)
संलग‍न‍:‍उपरिललखखत
DRAFTS IN WIDE
CIRCULATION
DOCUMENT DESPATCH ADVICE
Reference
Date
26-11-2014
ET 19/ T-24 & T-25
TECHNICAL COMMITTEE ETD 19
---------------------------------------------------------------------------------------------------------------ADDRESSED TO:
1.
All Members of High Voltage Engineering Sectional Committee, ET 19;
2.
All Members of Electrotechnical Division Council; and
3.
All other Interested.
Dear Sir(s),
Please find enclosed a copy of the following draft Indian Standard:
Doc No.
ETD 19 (6809)
ETD 19 (6810)
Title
Instruments and software used for measurement in high-voltage impulse
tests – Part 1:Requirements for instruments [ IEC 61083-1 : 2001]
Instruments and software used for measurement in high-voltage and high
current tests – Part 2: Requirements for software for tests with impulse
voltages and currents [ IEC 61083-2 : 2013]
Kindly examine the draft standards and forward your views stating any difficulties which you are
likely to experience in your business or profession, if these are finally adopted as Indian
Standards.
Comments, if any, may please be made in the format given overleaf and mailed to the
undersigned.
Last date for comments:
15-01-2015.
In case no comments are received or comments received are of editorial nature, you will kindly
permit us to presume your approval for the above documents as finalized. However, in case of
comments of technical in nature are received then it may be finalized either in consultation with
the Chairman, Sectional Committee or referred to the Sectional Committee for further necessary
action, if so desired by the Chairman, Sectional Committee.
It may kindly be noted that the technical contents of the documents has not been enclosed as
these are identical with the corresponding IEC standards. For details, please refer to the
corresponding IEC publication as mentioned in the respective National Forewords or
kindly contact the undersigned.
Thanking you,
Yours faithfully
(Mahim Jain)
Sc ‘F’ & Head (Electrotechnical)
Email: [email protected]
Encl : See attachment.
Date
26-11-2014
Sl.
No.
Name of the
Organization
Clause/
Subclause
Paragraph/
Figure/Table
Document No.
Doc: ET 19(6809), Doc: ET 19(6810),
Type of
Comment
(General/
Technical/
Editorial
Comments
Proposed
Change
Doc ET 19(6809)
BUREAU OF INDIAN STANDARDS
DRAFT FOR COMMENTS ONLY
(Not to be reproduced without the permission of BIS or used as a STANDARD)
Draft Indian Standard
Instruments and software used for measurement in high-voltage impulse tests –
Part 1:Requirements for instruments
Last date for receipt of comments is : 15-1- 2015
----------------------------------------------------------------------------------------------------------------------------- ----
High Voltage Engineering Sectional Committee, ET 19
NATIONAL FOREWORD
This Indian Standard (Part 1) which is identical with IEC 61083-1 : 2001 Instruments
and software used for measurement in high-voltage impulse tests – Part 1:Requirements
for instruments issued by the International Electrotechnical Commission (IEC) was
adopted by the Bureau of Indian Standards on the recommendation of the High Voltage
Engineering Sectional Committee and approval of the Electrotechnical Division Council.
The text of IEC standard has been approved as suitable for publication as an Indian
Standard without deviations.
Certain conventions are, however, not identical to those used in Indian Standards.
Attention is particularly drawn to the following:
a)
Wherever the words ‘International Standard’ appear referring to this standard,
they should be read as ‘Indian Standard’;
b) Comma (,) has been used as a decimal marker, while in Indian Standards the
current practice is to use a point (.) as the decimal marker.
In this adopted standard, reference appears to certain International Standards for which
Indian Standards also exist. The corresponding Indian Standards which are to be
substituted in their respective places are listed below along with their degree of
equivalence for the editions indicated:
International Standard
Corresponding Indian Standard
Degree of
Equivalence
IEC 60060-1:1989, High-voltage test
techniques – Part 1: General
definitions and test
requirements
IEC 60060-2:1994 High-voltage test
IS 2071(Part 1):1993 Highvoltage test techniques - Part 1
General definitions and test
requirements
IS/IEC 60060-2:2010 High-
Technically
Equivalent
Identical
techniques – Part 2: Measuring
systems Amendment 1 (1996)
voltage test techniques – Part 2:
Measuring systems
The technical committee has reviewed the provisions of the following International
Standard referred in this adopted standard and has decided that this is acceptable for use
in conjunction with this standard:
International Standards
IEC 61000-4-4:1995
Title
Electromagnetic compatibility (EMC) – Part 4: Testing and
measurement techniques – Section 4: Electrical fast transient/burst
immunity test. Basic EMC Publication
Only the English language text in the International Standard has been retained while
adopting it in the Indian Standard, and as such the page numbers given here are not the
same as in the IEC Publication.
For the purpose of deciding whether a particular requirement of this standard is complied
with, the final value, observed or calculated, expressing the result of a test or analysis,
shall be rounded off in accordance with IS 2 : 1960 ‘Rules for rounding off numerical
values (revised)’. The number of significant places retained in the rounded off value
should be the same as that of the specified value in this standard.
Doc ET 19(6810)
BUREAU OF INDIAN STANDARDS
DRAFT FOR COMMENTS ONLY
(Not to be reproduced without the permission of BIS or used as a STANDARD)
Draft Indian Standard
Instruments and software used for measurement in high-voltage and high current tests –
Part 2: Requirements for software for tests with impulse voltages and currents
Last date for receipt of comments is : 15-1-2015
--------------------------------------------------------------------------------------------------------------------------- ------
High Voltage Engineering Sectional Committee, ET 19
NATIONAL FOREWORD
This Indian Standard (Part 2) which is identical with IEC 61083- 2 : 2013 Instruments
and software used for measurement in high-voltage and high current tests – Part 2:
Requirements for software for tests with impulse voltages and currents issued by the
International Electrotechnical Commission (IEC) was adopted by the Bureau of Indian
Standards on the recommendation of the High Voltage Engineering Sectional Committee
and approval of the Electrotechnical Division Council.
The text of IEC standard has been approved as suitable for publication as an Indian
Standard without deviations.
Certain conventions are, however, not identical to those used in Indian Standards.
Attention is particularly drawn to the following:
a)
Wherever the words ‘International Standard’ appear referring to this standard,
they should be read as ‘Indian Standard’;
b) Comma (,) has been used as a decimal marker, while in Indian Standards the
current practice is to use a point (.) as the decimal marker.
In this adopted standard, reference appears to certain International Standards for which
Indian Standards also exist. The corresponding Indian Standards which are to be
substituted in their respective places are listed below along with their degree of
equivalence for the editions indicated:
International Standard
Corresponding Indian Standard
Degree of
Equivalence
IEC 60060-1:2010 High-voltage test
techniques – Part 1: General
definitions and test
requirements
IS 2071(Part 1):1993 Highvoltage test techniques - Part 1
General definitions and test
requirements
Technically
Equivalent
IEC 60060-2:1994, High-voltage
test techniques – Part 2: Measuring
systems
IS/IEC 60060-2:2010 Highvoltage test techniques – Part 2:
Measuring systems
Identical
IEC 60060-3:2006, High-voltage
test techniques – Part 3: Definitions
and requirements for on–site testing
IS/IEC 60060-3:2006, Highvoltage test techniques – Part 3:
Definitions and requirements for
on–site testing
Identical
The technical committee has reviewed the provisions of the following International
Standard referred in this adopted standard and has decided that this is acceptable for use
in conjunction with this standard:
International Standards
Title
IEC 61083-1:2001
IEC 61083-1:2001, Instruments and software used for
measurement in high-voltage impulse tests – Part 1: Requirements
for instruments
IEC 62475:2010
IEC 62475:2010, High-current test techniques – Definitions and
requirements for test currents and measuring systems
ISO/IEC Guide 98-3
ISO/IEC Guide 98-3, Uncertainty of measurement – Part 3: Guide
to the expression of uncertainty in measurement (GUM:1995)
Only the English language text in the International Standard has been retained while
adopting it in the Indian Standard, and as such the page numbers given here are not the
same as in the IEC Publication.
For the purpose of deciding whether a particular requirement of this standard is complied
with, the final value, observed or calculated, expressing the result of a test or analysis,
shall be rounded off in accordance with IS 2 : 1960 ‘Rules for rounding off numerical
values (revised)’. The number of significant places retained in the rounded off value
should be the same as that of the specified value in this standard.