2nd Midwest Imaging and Microanalysis Workshop at Notre Dame New Trends in In-situ and High Resolution Electron Microscopy for Nano- technology and Nano-science Tuesday, May 19th, 2015 Location: McKenna Hall – Room 210-214 (lectures) and Stinson-Remick Hall, Rooms B10, B03 (demo sessions). Contact for workshop info: Email: [email protected], Ph.: 1 (574) 631-8251 Agenda, May 19, 2015 8:15am Registration, Demo sign-up, Poster set-up (McKenna Hall, atrium). Session 1. Chairs: Sergei Rouvimov and Masaru Kuno (McKenna Hall – Room 210-214) 8:30 - 8:35am 8:35 - 8:40am 8:40 - 9:10am Welcome: Dean Peter Kilpatrick, University of Notre Dame Opening: Bradley Smith, NDIIF, University of Notre Dame Investigating Interfaces and Interfacial Phenomena on the Atomic Scale, David W. McComb, The Ohio State University 9:10 - 9:40am Exploring Lithium-ion battery performance through in situ and operando characterization, Dean Miller, Argonne National Laboratory 9:40 - 10:10am Advanced Focused Ion Beam Techniques for the Observation, Characterization and Nanoscale Modification and Manipulation of Advanced Materials: Fun with Ions, John Mansfield, University of Michigan 10:10 - 10:40am Atomic Dynamics in the Supercooled Liquid of Glass-forming Alloys, Paul Voyles, University of Wisconsin Madison 10:40- 11:00am COFFEE BREAK Session 2. Chairs: Alexander Mukasyan and Jon Camden (McKenna Hall – Room 210-214) 11:00 - 11:30am High Resolution Analysis in 3 dimensions, what are the issues?, Jan Ringnalda, FEI, Inc. 11:30 - 12:00pm Compositional and Thickness Measurements of Thin Films in the Scanning Electron Microscope, Richard McLaughlin, Oxford Instruments 12:00 - 12:30pm Cathodoluminescence in the STEM, Britt Lassiter, GATAN Inc. 12:30 - 1:00pm Advances in TEM Sample Preparation using DualBeam Systems, Jace McNeil, FEI, Inc. 1:00 - 2:30pm LUNCH and POSTER SESSION. Chairs: Dallas Rensel & Khachatur Manukyan (McKenna Hall, Lunch - Lower Level Dining Area – Posters Atrium 2nd Floor) Session 3. Chairs: Mathew Leevy and Bradley Smith (McKenna Hall – room 210-214) 2:30 - 2:45pm 2:45 - 3:00pm 3:00 - 3:30pm 3:30 - 3:50pm 3:50 - 4:10pm 4:10 - 4:40pm 4:40pm 6:00 pm Contrast-Enhanced X-ray Detection of Microcalcifications using Targeted Gold Nanoparticles, Lisa Cole, University of Notre Dame Elucidating Nanostructure-Property Relationships for Mixed Mosaic Membranes Prepared by Layer by Layer Assembly Using Microscopy, W. Phillip, University of Notre Dame Applications of low-loss EELS to imaging energy transfer from plasmonic nanoparticles into semiconductors by Jon Camden, University of Notre Dame In-situ TEM on catalysts at atmospheric pressure with a novel gas cell, Shuyi Zhang, University of Michigan Electron Microscopy the 3rd Dimension, Mark Kelsey, Bruker Inc. Characterization of multi-component materials stacks: linking electrical and structural materials properties, Gennadi Bersuker, Sematech Closing of the workshop DINNER (speakers) / Business Meeting - The Mark Dine & Tap 1234 Eddy Street, Suite 111, South Bend, IN 46617 Phone: 574-204-2767 May 20th, 2014 9:00am - 5:00pm Vendor’s tutorials and demo sessions (Stinson-Remick Hall, Rooms B03 and B10) Jace McNeil: Helios FIB/SEM Demonstrator, Jan Ringnalda: FEI Titan 80-300 TEM Demonstrator Note: the detailed schedule will be provided at the registration. For additional workshop information and campus map visit: http://ndiif.nd.edu Sponsors: FEI, Protochips, Inc., Oxford Instruments, GATAN, University of Notre Dame (Office of Research, College of Engineering, College of Science, NDIIF, Department of Electrical Engineering, CBE Department, ND Energy Center, ND Nano Center)