Columbia International Publishing
Contemporary Mathematics and Statistics
(2015) Vol. 3 No. 1 pp. 1-7
doi:10.7726/cms.2015.1001
Research Article
Haar Wavelet and Simulation of Stochastic Processes
Ievgen Turchyn1*
Received June 29 2013; Published online April 25 2015
© The author 2015. Published with open access at www.uscip.us
Abstract
A wavelet-based method for simulation of Gaussian processes with given accuracy and reliability in
πΏπ ([0, π]) is proposed.
Keywords: Gaussian processes; Simulation; Wavelets
1. Introduction
Applications of wavelets to stochastic processes have been extensively developed recently. In
particular, wavelet-based simulation and series expansions of stochastic processes have been
studied by Wornell (1993), Meyer et al. (1999), Whitcher (2001), Seleznjev and Staroverov (2002),
Ayache and Taqqu (2003), Pipiras (2004, 2005). Wavelet-based expansions of stochastic processes
in series with uncorrelated terms have been researched by Walter and Zhang (1994), Didier and
Pipiras (2008), Kozachenko et al. (2011).
We will prove a result about simulation of a Gaussian process with given accuracy and reliability
using a wavelet-based model. Simulation with given accuracy and reliability (see Kozachenko and
Pashko (1999)) is a special kind of simulation of stochastic processes. To simulate a random
process π(π‘) with given accuracy π and reliability 1 β πΏ means to build such a model πΜ(π‘) for the
process π(π‘) that
P{β₯ π(π‘) β πΜ(π‘) β₯> π} β€ πΏ
(so simulation with given accuracy and reliability is a simulation with a certain prescribed rate of
convergence). This kind of simulation has substantial advantages over more traditional methods of
simulation of stochastic processes. For instance, traditional methods of simulation may produce
models which paths are quite different from paths of the process but simulation with given
__________________________________________________________________________________________________________________
*Corresponding e-mail: [email protected]
1 Oles Honchar Dnipropetrovsk National University, Dnipropetrovsk, Ukraine
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Ievgen Turchyn / Contemporary Mathematics and Statistics
(2015) Vol. 3 No. 1 pp. 1-7
accuracy and reliability will result in a model which paths are with high probability close to paths of
the process.
Our model of a process is obtained by a truncation of a wavelet-based expansion of a stochastic
process. We prove a theorem about simulation of a Gaussian process with given accuracy and
reliability in πΏπ ([0, π]) using this wavelet-based model and the Haar wavelet. Analogous results
about simulation of Gaussian and sub-Gaussian processes with given accuracy and reliability by
means of a similar model have been obtained before in Kozachenko and Turchyn (2008) and
Turchyn (2011). Our result is valid for a wide class of Gaussian processes, this class includes certain
processes to which earlier theorems about simulation with given accuracy and reliability using
similar wavelet-based models are not applicable.
2. Preliminaries
Let π β πΏ2 (β) be such a function that the following assumptions hold:
i) βπββ€ |πΜ(π¦ + 2ππ)|2 = 1 almost everywhere, where πΜ(π¦) is the Fourier transform of π,
πΜ(π¦) = β« exp{βππ¦π₯}π(π₯)ππ₯;
β
ii) There exists a function π0 β πΏ2 ([0,2π]) such that π0 (π₯) has period 2π and almost
everywhere
πΜ(π¦) = π0 (π¦β2)πΜ(π¦β2);
iii) πΜ(0) β 0 and the function πΜ(π¦) is continuous at 0.
The function π(π₯) is called π-wavelet. Let π(π₯) be the inverse Fourier transform of the function
πΜ(π¦) = π0 (π¦β2 + π)exp{βππ¦β2}πΜ(π¦β2).
The function π(π₯) is called π-wavelet.
Let
πππ (π₯) = 2π/2 π(2π π₯ β π), πππ (π₯) = 2π/2 π(2π π₯ β π), π β β€, π = 0,1,2, β¦
It is known that the family of functions {π0π , πππ , π = 0,1, β¦ ; π β β€} is an orthonormal basis in πΏ2 (β)
(see, for example, Walter and Shen (2000)).
Any function π β πΏ2 (β) can be represented as
π(π₯) = βπββ€ πΌ0π π0π (π₯) + ββ
π=0 βπββ€ π½ππ πππ (π₯),
(2.1)
where πΌ0π = β«β π(π₯)π0π (π₯)ππ₯, π½ππ = β«β π(π₯)πππ (π₯)ππ₯,
2
βπββ€ |πΌ0π |2 + ββ
π=0 βπββ€ |π½ππ | < β.
That is, series (2.1) converges in the norm of the space πΏ2 (β). Representation (2.1) is called wavelet
representation.
We need the following result.
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Ievgen Turchyn / Contemporary Mathematics and Statistics
(2015) Vol. 3 No. 1 pp. 1-7
Theorem 2.1 Let π = {π(π‘), π‘ β β} be a centered random process such that for all π‘ β β π|π(π‘)|2
is finite. Let π
(π‘, π ) = ππ(π‘)π(π ) and there exists such a Borel function π’(π‘, π¦), π‘ β β, π¦ β β that
β«β |π’(π‘, π¦)|2 ππ¦ < β for all π‘ β β and
π
(π‘, π ) = β«β π’(π‘, π¦)π’(π , π¦)ππ¦.
Let {π0π (π₯), πππ (π₯), π β β€, π = 0,1,2, β¦ } be a wavelet system. Then the process π(π‘) can be presented
as the following series which converges for all π‘ β β in mean square:
π(π‘) = βπββ€ π0π πΌ0π (π‘) + ββ
π=0 βπββ€ πππ π½ππ (π‘),
(2.2)
where
πΌ0π (π‘) = β«β π’(π‘, π¦) Μ
Μ
Μ
Μ
Μ
Μ
Μ
Μ
Μ
π0π (π¦)ππ¦,
(2.3)
Μ
Μ
Μ
Μ
Μ
Μ
Μ
Μ
Μ
π½ππ (π‘) = β«β π’(π‘, π¦)π
ππ (π¦)ππ¦,
(2.4)
π0π , πππ are centered random variables such that
ππ0π π0π = πΏππ , ππππ πππ = πΏππ πΏππ , ππ0π πππ = 0 .
Theorem 2.1 is a corollary from Theorem 1.1 in Kozachenko et al. (2011) which is obtained by
taking {π0π , πππ , π = 0,1, β¦ ; π β β€} as an orthonormal basis.
We will use the term βW-expansion of the process X(t)β for expansion (2.2).
3. Simulation
Lemma 3.1 Suppose that a random process π = {π(π‘), π‘ β β} satisfies the conditions of Theorem 2.1,
the function π’(π‘, π¦) defined in Theorem 2.1 is differentiable with respect to y and satisfies the
following conditions:
π΄(π‘)
|π’π¦β² (π‘, π¦)| β€ 1+|π¦|π½ ,
(3.1)
where π½ β (1; 3/2),
π΅(π‘)
|π’(π‘, π¦)| β€ 1+|π¦| .
(3.2)
Let π(π‘) and π(π‘) be the Haar π -wavelet and π -wavelet correspondingly. Then the following
inequalities hold for the coefficients πΌ0π (π‘) πππ π½ππ (π‘) in W-expansion (2.2) of the process X(t) with
respect to the Haar wavelet:
π΅(π‘)
|πΌ0π (π‘)| β€ 1+min{|π|,|π+1|} ,
(3.3)
|π½ππ (π‘)| β€ 4π π½ 2π(3/2βπ½) , π > 0 ,
(3.4)
π΄(π‘)
π΄(π‘)
|π½ππ (π‘)| β€ 4|π+1/2|π½ 2π(3/2βπ½) , π < 0 ,
π΄(π‘)
|π½π0 (π‘)| β€ 4 β23π/2 .
(3.5)
(3.6)
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Ievgen Turchyn / Contemporary Mathematics and Statistics
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Proof. Let us prove inequality (3.4). We have for π > 0:
|π½ππ (π‘)| = |β« π’(π‘, π₯) 2
π β2
π
π(2 π₯ β π)ππ₯| = 2
π β2
(π+1β2)β2π
β€2
π β2
(π+1β2)β2π
β«
π β 2π
|π’(π‘, π₯) β π’ (π‘, π₯ +
π’(π‘, π₯) ππ₯ β β«
|β«
πβ2π
β
1
2π+1
(π+1)β2π
(π+1β2)β2π
π’(π‘, π₯) ππ₯|
)| ππ₯ β€ sup |π’π₯β² (π‘, π₯)|/23πβ2+2 ,
π₯βπΌ
where πΌ = [π/2π ; (π + 1/2)/2π ] . But it follows from (3.1) that
2ππ½
supπ₯ β πΌ |π’π₯β² (π‘, π₯)| β€ π΄(π‘) π π½
and now we immediately obtain inequality (3.4).
Inequalities (3.3), (3.5) and (3.6) can be proved in a similar way.
Definition 3.1 Let a random process π = {π(π‘), π‘ β β} satisfy the conditions of Theorem 2.1. We call
the following process a model of π(π‘):
ππ β1
π0 β1
πΜ(π‘) = βπ=β(π
π πΌ (π‘) + βπβ1
π=0 βπ=β(π
0 β1) 0π 0π
π β1)
πππ π½ππ (π‘),
(3.7)
where π0π , πππ are random variables from expansion (2.2), πΌ0π (π‘) and π½ππ (π‘) are calculated using
formulae (2.3) and (2.4), π0 > 1, π > 1, ππ > 1.
Definition 3.2 Suppose that 0 < πΏ < 1, π > 0. We say that the model πΜ(π‘) defined by (3.7)
approximates a process π(π‘) with given reliability 1 β πΏ and accuracy π in πΏπ ([0, π]) if
1/π
T
P{(β«0 |π(π‘) β πΜ(π‘)|π ππ‘)
> π} β€ πΏ.
We will need the following fact which is a modification of Theorem 5.1 from Kozachenko and
Turchyn (2008).
Theorem 3.1 Suppose that a Gaussian random process π = {π(π‘), π‘ β β} satisfies the conditions of
Theorem 2.1, πΜ(π‘) is its model defined by (3.7), 0 < πΏ < β2π βπ/2 , π β₯ 1. If
π2
sup π|π(π‘) β πΜ(π‘)|2 β€ 2π 2/π ln(
π‘β[0,π]
β2/πΏ)
,
then the model πΜ(π‘) approximates the process π(π‘) with reliability 1 β πΏ and accuracy π in πΏπ ([0, π]).
Now we can formulate and prove the main result of the paper.
Theorem 3.2 Suppose that a centered Gaussian stochastic process π = {π(π‘), π‘ β β} satisfies the
conditions of Lemma 3.1, π΄(π‘), π΅(π‘), π½ are defined in Lemma 3.1, π > 0,
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Ievgen Turchyn / Contemporary Mathematics and Statistics
(2015) Vol. 3 No. 1 pp. 1-7
π΄Μ(π) = sup π΄(π‘) < β,
π‘β[0,π]
π΅Μ(π) = sup π΅(π‘) < β,
π‘β[0,π]
the function π’(π‘, π¦) defined in Theorem 2.1 is continuous with respect to t, π’(π‘,β
) β πΏ1 (β) β© πΏ2 (β) and
inverse Fourier transform π’Μ(π‘, π¦) of the function π’(π‘, π¦) with respect to π¦ is a real function. Let π(π‘)
and π(π‘) be the Haar π-wavelet and π-wavelet respectively. Let π > 1, π > 0, πΏ β (0; β2π βπ/2 ). If
π0 > 4 +
6
(π΅Μ(π))2 ,
π1
(3.8)
3(π΄Μ(π))2
)1/(2π½β1)
8(2π½β1)π1 (1βπ)
3
2
ππ > + (
π > max{
ln(πΏ(1βπ))
lnπ
7
(π = 0,1, . . . , π β 1 ),
π
1
, βlog 8 (3 (π΄Μ(π))
2 )} ,
(3.9)
(3.10)
where
π1 =
π2
2π 2/π ln(β2/πΏ)
,
π = 4π½β3/2 ,
2 2π½
Μ
πΏ = 8π1 /(3(π΄(π)) (2 + 22π½β1 /(2π½ β 1) + 2π½/(2π½ β 1))),
then the model πΜ(π‘) defined by (3.7) approximates the process π(π‘) with given reliability 1 β πΏ and
accuracy π in πΏπ ([0, π]) .
Proof. It follows from (3.8)β(3.10) that the following inequalities hold:
sup βπ:|π|β₯π0 |πΌ0π (π‘)|2 β€
π1
,
3
(3.11)
2
sup βπβ1
π=0 βπ:|π|β₯ππ |Ξ²ππ (π‘)| β€
π1
,
3
(3.12)
2
sup ββ
π=π βπββ€ |Ξ²ππ (π‘)| β€
π1
.
3
(3.13)
π‘ β[0,π]
π‘ β[0,π]
π‘ β[0,π]
We will prove inequality (3.13) (inequalities (3.11) and (3.12) can be proved similarly). Let us take
an arbitrary fixed π‘ β [0, π]. Using estimates (3.4)β(3.6) it is easy to obtain the inequalities
(π΄(π‘))2
(π΄(π‘))2
1
1
β
β
β1
2
ββ
π=π βπββ€ |Ξ²ππ (π‘)| β€ βπ=π(16β22π(3/2βπ½) βπ=1 π 2π½ + 16β22π(3/2βπ½) βπ=ββ |π+1/2|2π½ +
β€
(π΄Μ(π))2
(π1 πΆπ½
16
(π΄(π‘))2
)
16β23π
1
+ π2 πΆπ½ + 7β8πβ1 ) = πΊ,
where
1
1
π1 = ββ
π=1 π 2π½ β€ 2π½β1 + 1,
1
22π½β1
2π½
π2 = ββ1
+ 2π½β1 ,
π=ββ |π+1/2|2π½ β€ 2
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Ievgen Turchyn / Contemporary Mathematics and Statistics
(2015) Vol. 3 No. 1 pp. 1-7
1
πΆπ½ = ββ
π=π 4 π(3/2βπ½) .
It follows from (3.10) that πΊ β€ π1 β3 and therefore (3.13) is true.
Finally, we deduce from (3.11)β(3.13) that
sup π|π(π‘) β πΜ(π‘)|2
π‘β[0,π]
β
2
2
= sup (βπ:|π|β₯π0 |πΌ0π (π‘)|2 + βπβ1
π=0 βπ:|π|β₯ππ |π½ππ (π‘)| + βπ=π βπββ€ |π½ππ (π‘)| ) β€ π1
π‘β[0,π]
and applying Theorem 3.1 we obtain the assertion of the theorem.
4. Conclusions
There has been proved a theorem about simulation of a Gaussian stochastic process with given
accuracy and reliability using a new wavelet-based model. This result holds for a wide class of
Gaussian processes.
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