SECTION 1.0 INTRODUCTION 1.1 HOW TO USE THIS MANUAL Read Section 1.0 for general information regarding the Model 6000 Series Test Station. For unpacking and setup information, and equipment familiarization, read Section 2.0. For information regarding how to operate this equipment, and instructions that will serve to introduce several equipment familiarization procedures, read Section 3.0. Section 4.0 provides maintenance and repair methods and recommended spare parts. 1.2 INTRODUCTION The Model 6000 Series Test Station (Ref. Fig. 1-1) provides probing capabilities for failure analysis, research and development design analysis and device characterization analysis It is also compatible with all of The MICROMANIPULATOR Co. extensive line of probes and accessories, making it an excellent foundation on which to build a complete probing system. The optional probe card holder and high resolution magnetic or vacuum based manipulators allow probe cards and high resolution diagnostic probes to be simultaneously used. The vacuum chuck can be easily lifted off and replaced with the socket chuck for probing packaged devices, or the hot\cold chuck fro specialized testing applications. Replacement of the vacuum chuck is just as simple, with no tedious re-planarization by the user. The 6000 Series Test Station features the MicroZoom ® or FS-60 microscopes which combine high magnification of very small geometries and long working distance objectives for ease of probing. Stability is very important at high magnifications, and the 6000 Series Test Station post provides the rigidity, X-Y translation (1" x 1"), and planar movement required for the microscope. For rapid wafer scanning, the high resolution manual stage can be supplemented with the optional motorized stage drive. 1.3 GENERAL DESCRIPTION If the test station has not been unpacked (Ref. Fig. 1-1), read the instructions for unpacking in Section 2.0. If the test station has been unpacked and is ready for assembly, read the Setup instructions in Section 2.0. If the test station has been setup and is ready to run and you have options to add, refer to the instructions in Section 3.0. LIFT DELAY ADJUSTMENT X-TRANSLATION HEIGHT STOP ANGULAR STOP PLATE PLATEN QUICK LIFT HANDLE 1 . 5 Y-TRANSLATION x SCOPE COARSE/FINE QUICK LIFT FOCUS RELEASE BUTTON STAGE VACUUM SWITCH UP BNC STRAIN RELIEF SYSTEM VACUUM MANIFOLD FIGURE 1-1. MODEL 6000 TEST STATION Those responsible for the care and up keep of the test station should become familiar with its various parts as illustrated in figure 1-1 and accompanying descriptions. 1.3.1 Stage Translation The 6000 Test Station wafer chuck stage is manually operated utilizing X and Y direction control knobs. Each of these control knobs have two knobs consisting of one small knob within a larger knob that are used for coarse and fine adjustment. As you are facing the instrument, the X adjustment is on the right and Y adjustment is on the left. To setup and view a Device Under Test (DUT), first manually position the probe in the general area to be probed, then position the microscope over the probe. Once the area has been established, position the stage (wafer chuck) with the coarse X and Y adjustment then fine tune with the fine adjustment. 1.3.2 Platen Up to eight (8) or more manipulators can be flexibly positioned on the platen. The highly polished magnetic stainless surface accepts vacuum or magnetic base manipulators. High resolution, excellent stability and true planar vertical motion combined to make this probe platform exceptionally useful. It can be raised or lowered in submicron increments or quickly raised more than 1 inch in a second. 1.3.3 Microscope Powerful microscope optics are well supported on a massive microscope post affording full 1" x 1" x 2" X-Y-Z translation. Scanning of a DUT is facilitated by stage and optic movements which are permanently planarized at the factory. 1.3.4 Chuck The vacuum chuck is easily replaced within seconds by the optional socket device holder which allows packaged devices to be conveniently powered and probed. It can the be easily replaced within seconds since chuck planarity is permanently set at the factory. Probe cards can be used along with individually positioned probes by using the optional probe card holder. 1.3.5 BNC Connectors Ten isolated BNC feed throughs are provided to interface the DUT to the test equipment, five on the left side of the platform and five on the right. They are to provide isolation and strain relief between any probe cables and external test equipment. These connectors are mounted in delrin in order to isolate them from the chassis. Each BNC is tested to ensure better than 5 teraohms isolation between each conductor and its outer shell. Also each BNC has greater than 5 teraohms isolation between itself and any other BNC connector as well as test station. 1.4 SPECIFICATIONS 1.4.1 Platen Accepts 8 or more magnetic or vacuum base manipulators 10 BNC strain relief's 1 in. (25.4 mm) thick honeycomb construction for maximum stability. Top surface electrically grounded to white terminal at rear of baseplate Fine Lift Control True planar vertical motion, convenient knob control Resolution: 0.3 micron per degree revolution Range: 0.5 in. (12.7 mm) Quick Lift Control Raises platen and microscope with adjustable microscope lift delay Range: 1.35 in. (34.3 mm) Resolution: 10:1 reduction (handle:platen) 1.4.2 X-Y Stage Range of motion 4 in. x 4 in. (101.6 mm x 101.6 mm) Movement permanently set a factory Theta rotation control full 360o with conveniently located locking knob Control knobs coaxial X-Y for single hand operation from either side, located center front Resolution of X-Y movement: 1.8 microns per degree revolution Optional two-speed motorized stage drive for rapid wafer scanning 1.4.3 Chuck Standard 4 in. (101.6 mm) diameter with dual tweezer slots Gold plated brass for low contact resistance Flatness + .0005 in. (+ 12 microns) Electrical isolation exceeds 5000 megohms at 500VDC Electrically connected to black terminal at rear of baseplate 1.4.4 Optional Socket Stage Conversion time chuck to socket and back to chuck less than 60 seconds Accepts P.C., cards with ZIF sockets for probing packaged devices while operating Locking handle for theta rotation control 1.4.5 Microscope and Post Vertical positioning + 1.4 in. (+ 36 mm) by moving pin support Vertical motion 0 - 1.36 in (34.3 mm) by platen Quick Lift handle or fine control with or fine control knob with adjustable delay X-Y translation: 1 in. x 1 in. (25.4 mm x 25.4 mm) with convenient knob control Factory planarized X-Y translation Coarse/fine focus control 1.4.6 Dimensions and Finish Size 20 in. (51 cm) wide x 18 in. (46 cm) deep x 24 in. (61 cm) high with optics Finish Grained black anodized aluminum for long life Weight 85 lbs. (38.5 kg) 1.4.7 Shipping Information Double wall carton with 4 in. foam between inner and outer box Carton Inner box = 32 1/2 x 29 x 22 Outer box = 38 x 38 x 32 1.4.8 Facility Requirements Power 117/60Hz standard, 220/50Hz optional Vacuum 20 in. mercury recommended for vacuum chuck Table Special vibration isolation tables usually not required due to excellent system stability (SPECIFICATIONS SUBJECT TO CHANGE WITHOUT NOTICE) NOTES ii TABLE OF CONTENTS SECTION TITLE PAGE 1.O 1.2 1.3 1.3.1 1.3.2 1.3.3 1.3.4 1.3.5 1.4 1.4.1 1.4.2 1.4.3 1.4.4 1.4.5 1.4.6 1.4.7 1.4.8 HOW TO USE THIS MANUAL............................................................... 1-1 INTRODUCTION...................................................................................... 1-1 GENERAL DESCRIPTION...................................................................... 1-1 Stage Translation........................................................................................... 1-3 Platen............................................................................................................. 1-3 Microscope..................................................................................................... 1-3 Chuck............................................................................................................. 1-3 BNC Connector.............................................................................................. 1-3 SPECIFICATIONS..................................................................................... 1-4 Platen............................................................................................................. 1-4 X-Y Stage...................................................................................................... 1-4 Chuck............................................................................................................. 1-4 Optional Socket Stage.................................................................................... 1-5 Microscope and Post...................................................................................... 1-5 Dimensions and Finish................................................................................... 1-5 Shipping Information..................................................................................... 1-5 Facility Requirements.................................................................................... 1-5 2.0 2.1 2.1.1 2.1.2 2.1.3 2.2 INSTALLATION AND SETUP PROCEDURES.................................... PRE-INSTALLATION PROCEDURES.................................................. Shipping Carton Inspection.......................................................................... Test Station Removal..................................................................................... Test Station Inspection.................................................................................. INSTALLATION AND SETUP................................................................ 2-1 2-1 2-1 2-1 2-1 2-2 2.3 2.3.1 2.3.2 2.3.3 2.3.4 2.3.5 SYSTEM FAMILIARIZATION............................................................... Microscope Controls..................................................................................... Platen............................................................................................................ Chuck............................................................................................................ BNC Connectors........................................................................................... Stage.............................................................................................................. 2-3 2-4 2-4 2-7 2-8 2-8 3.0 3.1 3.2 3.3 ACCESSORY INSTALLATION.............................................................. INTRODUCTION...................................................................................... AMBIENT AND THERMAL CHUCK REMOVAL.............................. MANIPULATORS...................................................................................... 3-1 3-1 3-1 3-3 iii SECTION TITLE PAGE 3.4 3.4.1 3.4.2 3.5 PROBE CARD HOLDER INSTALLATION.......................................... Probe Card Holder Installation Procedure..................................................... Probing the Interior of the Probe Card........................................................... MICROSCOPE LIFT LOCK MECHANISM......................................... 4.0 4.1 4-1 4.2 4.2.1 4.2.2 4.3 4.4 4.5 4.5.1 4.5.2 4.6 MAINTENANCE AND SPARE PARTS.................................................. 4-1 INTRODUCTION......................................................................................... CLEANING................................................................................................. Cleaning the Test Station.............................................................................. Cleaning the Microscope Eyepieces.............................................................. JACKSCREW REPLACEMENT............................................................. BELT REPLACEMENT............................................................................ LUBRICATION.......................................................................................... Microscope Lubrication................................................................................ Stage Lubrication.......................................................................................... RECOMMENDED SPARE PARTS......................................................... 3-5 3-6 3-6 3-7 4-1 4-2 4-2 4-3 4-4 4-4 4-5 4-5 4-7 SECTION 3.0 ACCESSORY INSTALLATION 3.1 INTRODUCTION This section will instruct you on how to install the following types of accessories: THERMAL CHUCK PROBE CARD HOLDER MANUAL MANIPULATOR 3.2 AMBIENT AND THERMAL CHUCK REMOVAL AND REPLACEMENT There are two types of CHUCKS that may be mounted in the probe station. These CHUCKS are AMBIENT and THERMAL. The ambient chuck is equipped with only vacuum to hold the wafer to its surface while under test; however the thermal chuck is equipped with plumbing for coolant and vacuum so that the wafer can be tested at temperature. The THERMAL chuck typically comes with a CONTROLLER with a manual provided for installation of the chuck with plumbing and electrical connections (Ref. Fig. 3-1) CHUCK HEATER WIRES COOLING RINGS THERMOCOUPLE AND SIGNAL WIRES TO ISOLATION BOX FIGURE 3-1. THERMAL CHUCK CHUCK REPLACEMENT PROCEDURE STEP 1. Although rigidly positioned, the ambient chuck may easily be removed by lifting it off its post.. First raise the microscope by means of the quick lift handle or microscope lift. Swing the low powered microscope objective into position to provide the most space for chuck removal. Disconnect the chuck potential wire. Remove the ambient chuck. STEP 2. Place the THERMAL chuck gently on its post and rotate and lower it until you feel the index pin drop into its slot and the chuck rest on the theta gear surface. CHUCK INDEXING SLOT FIGURE 3-2. CHUCK PIN INDEXING SLOT STEP 3. Using the HSM CONTROLLER manual, make the proper plumbing and electrical connections. 3.3 MANIPULATORS Manipulators are devices designed to position probes to be placed on pads or other features of the specimen to be tested. Various electrical connections can be made to the probe, probe holders and probe tips which also vary in construction. Reference Probe Guide (P/N A1009784) for details for your particular application. Manipulators are placed around the periphery of the platen, surrounding the wafer or specimen, in proximity of the location to be probed. Stable position is maintained by magnets or vacuum ports in the base of the manipulators. Fine positioning of the manual manipulator is controlled by three knobs which position the probe holder as a fulcrum or rectilinearly depending on the model. Precision of positioning also varies by model. PROBE HOLDER SHANK COLLET CLOSURE NUT FIGURE 3-3. COLLET AND CLOSURE NUT To save time when gross positioning, position the microscope over the area to be probed. Switch the illuminator on and position the probe point under the cone of the light. Be sure the Z setting is high enough to clear the specimen with the manipulator base in full contact with the platen surface and vacuum engaged. Fine positioning can now be accomplished with increasing magnification and adjusting the manipulator controls. 3.4 PROBE CARD HOLDER INSTALLATION (OPTION 6000-FPC-FR4) The standard probe card is 4 1/2 inches wide. The PROBE CARD HOLDER (Ref. Fig. 3-4) must suspend it over the wafer or device with provisions for making the plane of the probes parallel to the plane of the device being probed. In addition, the connector at the edge of the probe card must be firmly anchored so that motion of the connecting cable does not disturb the position of the probes. REAR MOUNTING SCREWS REAR HEIGHT ADJUSTMENT HEIGHT ADJUSTMENT SCREWS (BOTH SIDES) FRONT MOUNTING SCREWS WITH HEIGHT ADJUSTMENT SLOT FIGURE 3-4. PROBE CARD HOLDER INSTALLATION 3.4.1 Probe Card Holder Installation Procedure The holder is easily mounted on the platen of the probe station by means of four screws. At both the front and rear are provisions for adjusting the height of the probe card at each corner. To install the probe card holder, perform the following steps: STEP 1. Place a piece of thin plastic or clean paper on the chuck surface (to protect the surface) and apply vacuum. STEP 2. STEP 3. Mount the probe card holder to the station platen. Mount the probe card edge connector to the holder and secure it in place. STEP 4. Gently lower the empty holder onto the chuck by means of the fine platen lift. STEP 5. STEP 6. With the holder lying flat on the chuck, tighten the four mounting screws. This will set the probe plane roughly parallel to the device plane. Raise the platen before proceeding. STEP 7. Release the vacuum and remove protective paper or plastic from the chuck. STEP 8. Load the probe card in the holder by sliding it between the holding brackets and holder rails into its edge connector. Tighten brackets. 3.4.2 Probing the Interior of the Probe Card The power of an analytical probe station is its capability to probe any point in the integrated circuit. While the probe card provides connection to the PADS, one or more independent probes can probe interior points (Ref. Fig. 3-5). As shown in the illustration, the probe and its holder are designed to extend over the probe card holder and under the microscope objective. A specific probe or probe holder designed for use with probe cards should be used. The probe holder shown in the illustration holds the convenient disposable probes which may be cut or bent to clear the microscope objective. Swing-Path Of Probe End Cut Highest Power Close To Holder Objective FPC-Type Probe Holder Probe Card FIGURE 3-5. PROBING WITH A PROBE CARD 3.5 MICROSCOPE LIFT LOCK MECHANISM The MICROSCOPE LIFT LOCK MECHANISM (MLLM) was designed to lift the microscope independent of the platen lift. The locking pin is spring loaded on the pinion hub so it is disengaged when not in use. With one hand the user can engage the pinion, lift the microscope, and engage the locking pin (Ref. Fig. 3-6). By raising the lift handle slightly, the locking pin will release automatically. Locking Pin Upwards To Lift Lift Handle FIGURE 3-6. LIFT LOCK MECHANISM LIFT LOCK OPERATION: STEP 1. TO ENGAGE: press the lift handle to the left side of the probe station. STEP 2. TO LIFT: operate lift handle . STEP 3. TO LOCK POSITION: press locking pin inward. STEP 4. TO DISENGAGE: operate lift handle upward until the locking pin disengages. The microscope can now be positioned up or down. Once the lift handle is released, the pinion will also disengage provided the microscope is not applying a load. NOTES SECTION 4.0 MAINTENANCE AND SPARE PARTS 4.1 INTRODUCTION Maintenance of the 6000 Test Station consists primarily of proper lubrication of the moving parts and a continuing effort to keep the equipment free from dust and other contaminants, such as wafer fragments or other particles. The time period between lubrications is dependent upon the location and usage levels of the test station. If it is located in an open area subject to dust or other contaminants, the station should be cleaned and lubricated more frequently than directed in this section. However, if the station is located in a clean area where the environment is more closely monitored, then less maintenance is required. In the event the test station is located in a corrosive atmosphere, it must be cleaned frequently to remove corrosive materials. At frequent intervals, all work surfaces should be wiped down with clean, lint free cloths or wipers, moistened with alcohol to aid in this process. Also, periodically clean the lenses on the microscope with a lens brush, followed by a nonabrasive wiper moistened with alcohol. View the eyepieces while rotating them to reveal particles that should be removed. The MICROMANIPULATOR Co.'s probing station products are designed to give the user many years of specified performance if proper care, handling and maintenance practices are observed. Calibration of manual and programmable probers or accessories may be required if the instrument in question has experienced any degradation due to excessive wear caused by improper maintenance, impact, tampering or unauthorized adjustment to any of the pertinent positioning system components such as leadscrews, nuts, bearing ways or support hardware. Further, if the operator notices any degradation in performance or inability to hit targets dimensionally within the specified positioning performance of the product, calibration may be required. It should be noted that lack of lubrication, excess dirt or grime about the positioning system components as well as improper setup may result in inaccurate positioning. The user should consult the operations manual or contact the factory (1-800-654-5659) with any questions or concerns arising with the use of these instruments. 4.2 CLEANING The probe station should be protected from dust by covering it when it is not in use for a prolonged time. Dust from laboratory remodeling and similar work can damage precision surfaces and fittings. Dust inside the microscope is costly to remove and will subtly degrade the view and strain the operator's eyes. The MICROMANIPULATOR Co. offers custom dust covers (P/N7000-DPCTV) which may be purchased at a nominal charge. 4.2.1 Cleaning the Probe Station Remove dust with a soft cloth or soft brush (do not blow dust and air in bearing ways). A strong air blast is the only way to get the dust out of crevices. For more vigorous cleaning, wipe with a light solvent or alcohol. ---------------------------------------------------------------------------------------CAUTION: DO NOT use soap, caustic materials, or other water based cleaning agents. ---------------------------------------------------------------------------------------A laboratory solvent or alcohol can be used to remove stains from the platen by rubbing with a soft cloth. DO NOT use abrasives. 4.2.2 Cleaning the Microscope Eyepieces Microscope eyepieces frequently need cleaning. The user will have a better view of the viewing area if the eyepieces are regularly checked and a few minutes are taken to clean them when needed. With the light on and the microscope out of focus (raise the microscope with the platen QUICK LIFT handle), rotate each eyepiece while looking through the microscope. Dirt and oil stains on the lens will be obvious by their rotation. If there is obvious dirt, there probably is also an oily film obscuring the view. To clean the lens, perform the following steps: STEP 1. Blow off loose dust with light air pressure. This will minimize abrasion of the lens when cleaning. STEP 2. With a cotton swab or camera grade lens tissue, wash the lens with a lens cleaning fluid. A commercial fluid or ethyl alcohol (with no denaturant other than methyl alcohol) are satisfactory. STEP 3. With a circular motion, start in the center of the lens and work outward, also rotating the swab. STEP 4. Use additional cotton swabs or lens tissue to remove all fluid. Four swabs may be needed to complete the cleaning of one lens, but the task will take only a few minutes and is worth the effort. STEP 5. Replace the lens and rotate it to inspect for remaining spots or films. 4.3 JACKSCREW REPLACEMENT Operator over enthusiasm, in the use of the FINE LIFT knob, may occasionally cause failure of the jackscrew (Ref. Fig. 4-1) that lifts the platen. Failure to properly adjust the LIFT DELAY forces the FINE LIFT mechanism to lift the microscope. The extra load may, over a long period of such adjustment, wear out the jackscrew. The jackscrew is easily replaced by performing the following steps: JACKSCREW IDLER FIGURE 4-1. JACKSCREW REMOVAL STEP 1. Clear lose objects and parts, raise the front of the probe station until the microscope post rest on a 3" to 4" stack of books placed behind the station. STEP 2. Loosen the screw (it is not necessary to remove the screw) that secures the idler (Ref. Fig. 4-1) and then remove belt between the large sprocket and small sprocket. Remove the sprocket located at the bottom center as you now see the underside of the station. It is secured by four small flat head screws. STEP 3. Remove the JACKSCREW (a 2" black cylinder). It is attached to the baseplate of the station by three socket head screws and can quickly be removed. STEP 4. If needed, lubricate the threads of the new JACKSCREW with the lubricant supplied with the station: G.E. Versilube, G322-L, Silicone Lubrication Grease. STEP 5. The 1/4" - thick anchor plate must slide freely, but be prevented from turning by the two guide screws that have the casual appearance of set screws. They are factory set, locked by second screws, and rarely, if ever need adjustment. STEP 6. Replace the JACKSCREW and appropriate belts, taking care to firmly tighten the mounting screws. 4.5 BELT REPLACEMENT The following illustration (Ref. Fig. 4-2) identifies the belts (with their appropriate part number) that may have to be replaced due to normal wear or breakage: (AS VIEWED FROM THE UNDERSIDE) P/N 6000-1-32 P/N 6000-1-36 P/N 6000-0559 (2 EA) FIGURE. 4-2. BELT IDENTIFICATION AND PART NUMBER 4.5 LUBRICATION If kept clean, the probe station requires little care. Once every 12 months the station should be cleaned and lubricated. Since all rotary bearings are sealed and do not need lubrication, the only parts that need lubricating are the STAGE, LEADSCREWS and the MICROSCOPE DRIVE. 4.5.1 Microscope Lubrication The microscope X-axis and Y-axis slides must be lubricated every 100 hours of use using the specific lubricant supplied (P/N 13128357). To lubricate, move the X-axis to the left side of its travel and lubricate the top and front of the brass slide (Ref. Fig. 4-3). Then move the X-axis to the right and lubricate the slide on top and front. To lubricate the Y-axis, move the scope toward the front of the station and lubricate the sides and top of the brass slide. Move the scope forward, backward and from side to side. Do this until all excess lubricant has pushed to the sides. The excess lubricant can now be wiped off with a lint free cloth. To lubricate the RACK and PINION assembly, you must first loosen the locking screw on the underside of the assembly so that the slide can be moved to expose most the RACK. Place a thin film of lubricant on the RACK portion of the assembly. Enough of the lubricant will be transferred to the PINION during normal operation. Return the slide and tighten the locking screw. If this assembly is over lubricated, a resistance to movement will occur. E IS W T K H C O IG L R C C O IN UN T E R C L O C K W IS E E IS W K C O L C R E T N U O C T F E L C L O C K W IS O E U T PINNION APPLY LUBRICANT RACK (UNDER SLIDE) LOCKING SCREW (UNDER SLIDE) X-AXIS SLIDE Y-AXIS SLIDE FIGURE 4-3. MICROSCOPE LUBRICATION 4.5.2 Stage Lubrication The X and Y axis bearings (Ref. Fig. 4-4) should be lubricated with G.E. Versilube lubricant (P/N 12138354). This cleans and protects the bearings from rust and dirt buildup. This should be performed every 100 hours. While you are facing the station move the X-axis to the extreme right and apply lubricant on both sets of bearings (on either side of the slide) then move the X-axis to the extreme left and apply lubricant. Move the X-axis slide to the extreme left and right several times to ensure that the lubricant has covered all bearings. With a lint free cloth, wipe excess lubricant from exposed parts. While you are still facing the station, move (with knobs) the Y-axis slide away from you as far as it will go. Apply lubricant to the bearings. Now move the Y-axis slide towards you as far as it will go. Apply lubricant to the rear bearings. Work the slide to its extreme positions until the lubricant has covered all bearings. With a lint free cloth, wipe off any excess lubricant that appears on exposed parts. (AS VIEWED FROM THE UNDERSIDE) LP LP LP LP LP LP LP LP LP = LUBRICATION POINTS FIGURE 4-4. STAGE LUBRICATION POINTS 4.7 RECOMMENDED PARTS LIST The following small parts are occasionally lost or are subject to breakage or replacement due to wear:. RECOMMENDED PART NUMBER DESCRIPTION QUANTITY 6000-1 Model 1 pins for probe leads (set of 6) 1 set 6000-0226 Button for Quick Lift handle 1 12600039 Chuck Ground Wire 1 Model 2 Collets 4 Model 5 Collets 4 Model 6 Collet Closer 1 6200-B Set of Belts (4) 1 set 2801-0073 Red Vacuum Hose 25 feet 6000-0146 Tubing, quarter inch, Clear Tygon 10 feet 16307006 O-ring (vacuum based manipulator) 4 Model 48 pin jack to BNC adapter 2 29065014 Jackscrew assembly (platen fine lift) 1 6000-0141 Vacuum switch, wafer hold down 1 13128357 Lubricant 1 12138354 GL Versilube 1 BELTS 6000-0136 Fine platen lift, 1st, at knob 6000-0132 2nd, between idlers 6000-559 X-Y stage movement 2 NOTES APPENDIX A ASSEMBLY DRAWINGS AND BILLS OF MATERIALS 6000 SERIES TEST STATION USER'S MANUAL 1555 Forrest Way Carson City, Nevada 89706 Tel: 775/882-2400 Fax: 775/882-7694 E-mail: [email protected] © Copyright 1996 by The Micromanipulator Company, Inc. Now Micromanipulator 1555 Forrest Way Carson City, NV 89706 REVISION 2.1 26JULY00 Printed in the USA Customer Order: P/N A1010555 Internal: P/N 10412009 FS 60 is a registered trademark of Mitutoyo Corporation MIRCOZOOM II is a registered trademark of Leica, Inc. Copyright © The MICROMANIPULATOR Co., Inc. Now MICROMANIPULATOR All rights reserved. MICROMANIPULATOR products are covered by U.S. and foreign patents, issued and pending. Information in this publication supersedes that in all previously published material, specifications and price change privileges reserved. MICROMANIPULATOR, 1555 Forrest Way, Carson City, NV 89706 6000 SERIES TEST STATION USER'S MANUAL THE MICROMANIPULATOR CO., INC. 1555 Forrest Way Carson City, Nevada 89706 Tel: 702 / 882-2400 Fax: 702 / 882-7694 [email protected] © Copyright 1996 by The Micromanipulator Company, Inc. 1555 Forrest Way Carson City, NV 89706 REVISION 2.0 11 March 1996 Printed in the USA P/N 10412009 FS 60 is a registered trademark of Mitutoyo Corporation MIRCOZOOM II is a registered trademark of Leica, Inc. Copyright © The MICROMANIPULATOR Co., Inc. All rights reserved. The MICROMANIPULATOR Co., Inc.'s products are covered by U.S. and foreign patents, issued and pending. Information in this publication supersedes that in all previously published material, specifications and price change privileges reserved. The MICROMANIPULATOR Co., Inc., 1555 Forrest Way, Carson City, NV 89706
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