VISHAY IRF74 datasheet

IRF740A, SiHF740A
Vishay Siliconix
Power MOSFET
FEATURES
PRODUCT SUMMARY
VDS (V)
• Low Gate Charge Qg Results in Simple Drive
Available
Requirement
• Improved Gate, Avalanche and Dynamic dV/dt RoHS*
COMPLIANT
Ruggedness
• Fully Characterized Capacitance and Avalanche Voltage
and Current
• Effective Coss Specified
• Lead (Pb)-free Available
400
RDS(on) (Ω)
VGS = 10 V
0.55
Qg (Max.) (nC)
36
Qgs (nC)
9.9
Qgd (nC)
16
Configuration
Single
D
TO-220
APPLICATIONS
• Switch Mode Power Supply (SMPS)
• Uninterruptable Power Supply
• High Speed Power Switching
G
S
G
TYPICAL SMPS TOPOLOGIES
D
S
• Single Transistor Flyback Xfmr. Reset
• Single Transistor Forward Xfmr. Reset (Both for US Line
Input Only)
N-Channel MOSFET
ORDERING INFORMATION
Package
TO-220
IRF740APbF
SiHF740A-E3
IRF740A
SiHF740A
Lead (Pb)-free
SnPb
ABSOLUTE MAXIMUM RATINGS TC = 25 °C, unless otherwise noted
PARAMETER
Gate-Source Voltage
Continuous Drain Current
VGS at 10 V
TC = 25 °C
TC = 100 °C
Pulsed Drain Currenta
SYMBOL
LIMIT
UNIT
VGS
± 30
V
ID
10
6.3
A
IDM
40
1.0
W/°C
Single Pulse Avalanche Energyb
EAS
630
mJ
Repetitive Avalanche Currenta
IAR
10
A
Repetitive Avalanche Energya
EAR
12.5
mJ
Linear Derating Factor
Maximum Power Dissipation
TC = 25 °C
Peak Diode Recovery dV/dtc
Operating Junction and Storage Temperature Range
Soldering Recommendations (Peak Temperature)
Mounting Torque
for 10 s
6-32 or M3 screw
PD
125
W
dV/dt
5.9
V/ns
TJ, Tstg
- 55 to + 150
300d
°C
10
lbf · in
1.1
N·m
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
b. VDD = 50 V, starting TJ = 25 °C, L = 12.6 mH, RG = 25 Ω IAS = 10 A (see fig. 12).
c. ISD ≤ 10 A, dV/dt ≤ 330 A/µs, VDD ≤ VDS, TJ ≤ 150 °C.
d. 1.6 mm from case.
* Pb containing terminations are not RoHS compliant, exemptions may apply
Document Number: 91051
S-81291-Rev. A, 16-Jun-08
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IRF740A, SiHF740A
Vishay Siliconix
THERMAL RESISTANCE RATINGS
PARAMETER
SYMBOL
TYP.
MAX.
Maximum Junction-to-Ambient
RthJA
-
62
Case-to-Sink, Flat, Greased Surface
RthCS
0.50
-
Maximum Junction-to-Case (Drain)
RthJC
-
1.0
UNIT
°C/W
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Static
Drain-Source Breakdown Voltage
VDS Temperature Coefficient
VDS
VGS = 0 V, ID = 250 µA
400
-
-
V
ΔVDS/TJ
Reference to 25 °C, ID = 1 mA
-
0.48
-
V/°C
VGS(th)
VDS = VGS, ID = 250 µA
2.0
-
4.0
V
Gate-Source Leakage
IGSS
VGS = ± 30 V
-
-
± 100
nA
Zero Gate Voltage Drain Current
IDSS
VDS = 400 V, VGS = 0 V
-
-
25
VDS = 320 V, VGS = 0 V, TJ = 125 °C
-
-
250
Gate-Source Threshold Voltage
Drain-Source On-State Resistance
Forward Transconductance
RDS(on)
gfs
ID = 6.0 Ab
VGS = 10 V
VDS = 50 V, ID = 6.0 Ab
µA
-
-
0.55
Ω
4.9
-
-
S
-
1030
-
-
170
-
Dynamic
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
Output Capacitance
Coss
Effective Output Capacitance
Coss
Total Gate Charge
Qg
Gate-Source Charge
Qgs
VGS = 0 V,
VDS = 25 V,
f = 1.0 MHz, see fig. 5
-
7.7
-
VGS = 0 V, VDS = 1.0 V, f = 1.0 MHz
-
1490
-
VGS = 0 V, VDS = 320 V, f = 1.0 MHz
-
52
-
VGS = 0 V, VDS = 0 V to 320 V
-
61
-
-
-
36
-
-
9.9
VGS = 10 V
ID = 10 A, VDS = 320 V,
see fig. 6 and 13b
Gate-Drain Charge
Qgd
-
-
16
Turn-On Delay Time
td(on)
-
10
-
Rise Time
Turn-Off Delay Time
Fall Time
tr
td(off)
VDD = 200 V, ID = 10 A,
RG = 10 Ω, RD = 19.5 Ω, see fig. 10b
tf
pF
nC
-
35
-
-
24
-
-
22
-
-
-
10
-
-
40
-
-
2.0
-
240
360
ns
-
1.9
2.9
µC
ns
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
IS
Pulsed Diode Forward Currenta
ISM
Body Diode Voltage
VSD
Body Diode Reverse Recovery Time
trr
Body Diode Reverse Recovery Charge
Qrr
Forward Turn-On Time
ton
MOSFET symbol
showing the
integral reverse
p - n junction diode
D
A
G
S
TJ = 25 °C, IS = 10 A, VGS = 0 Vb
TJ = 25 °C, IF = 10 A, dI/dt = 100 A/µsb
V
Intrinsic turn-on time is negligible (turn-on is dominated by LS and LD)
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
b. Pulse width ≤ 300 µs; duty cycle ≤ 2 %.
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Document Number: 91051
S-81291-Rev. A, 16-Jun-08
IRF740A, SiHF740A
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
100
100
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
I D , Drain-to-Source Current (A)
10
1
0.1
4.5V
20μs PULSE WIDTH
TJ = 25 °C
0.01
0.1
1
10
100
TJ = 150 ° C
1
TJ = 25 ° C
0.1
4.0
V DS = 50V
20μs PULSE WIDTH
5.0
6.0
7.0
8.0
9.0
VDS , Drain-to-Source Voltage (V)
VGS , Gate-to-Source Voltage (V)
Fig. 1 - Typical Output Characteristics, TC = 25 °C
Fig. 3 - Typical Transfer Characteristics
100
3.0
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
TOP
I D , Drain-to-Source Current (A)
10
10
1
4.5V
20µs PULSE WIDTH
TJ = 150 ° C
0.1
0.1
1
10
100
VDS , Drain-to-Source Voltage (V)
Fig. 2 - Typical Output Characteristics, TC = 150 °C
Document Number: 91051
S-81291-Rev. A, 16-Jun-08
RDS(on) , Drain-to-Source On Resistance
(Normalized)
I D , Drain-to-Source Current (A)
TOP
10.0
ID = 10A
2.5
2.0
1.5
1.0
0.5
0.0
-60 -40 -20
VGS = 10V
0
20
40
60
80 100 120 140 160
TJ , Junction Temperature ( °C)
Fig. 4 - Normalized On-Resistance vs. Temperature
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IRF740A, SiHF740A
Vishay Siliconix
100
100000
C, Capacitance(pF)
10000
ISD , Reverse Drain Current (A)
VGS = 0V,
f = 1 MHZ
Ciss = Cgs + Cgd , Cds SHORTED
Crss = Cgd
Coss = Cds + Cgd
Ciss
1000
Coss
100
10
Crss
10
TJ = 150 ° C
TJ = 25 ° C
1
1
1
10
100
1000
0.1
0.2
VDS, Drain-to-Source Voltage (V)
0.6
0.8
1.0
1.2
1.4
Fig. 7 - Typical Source-Drain Diode Forward Voltage
100
ID = 10A
OPERATION IN THIS AREA LIMITED
BY RDS(on)
VDS = 320V
VDS = 200V
VDS = 80V
16
10us
ID , Drain Current (A)
VGS , Gate-to-Source Voltage (V)
0.4
VSD ,Source-to-Drain Voltage (V)
Fig. 5 - Typical Capacitance vs. Drain-to-Source Voltage
20
V GS = 0 V
12
8
100us
10
1ms
4
FOR TEST CIRCUIT
SEE FIGURE 13
0
0
10
20
30
40
1
TC = 25 ° C
TJ = 150 ° C
Single Pulse
10
10ms
100
1000
QG , Total Gate Charge (nC)
VDS , Drain-to-Source Voltage (V)
Fig. 6 - Typical Gate Charge vs. Gate-to-Source Voltage
Fig. 8 - Maximum Safe Operating Area
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Document Number: 91051
S-81291-Rev. A, 16-Jun-08
IRF740A, SiHF740A
Vishay Siliconix
RD
VDS
10.0
VGS
D.U.T.
RG
+
- VDD
ID , Drain Current (A)
8.0
10 V
Pulse width ≤ 1 µs
Duty factor ≤ 0.1 %
6.0
Fig. 10a - Switching Time Test Circuit
4.0
VDS
90 %
2.0
0.0
25
50
75
100
125
150
10 %
VGS
TC , Case Temperature ( ° C)
td(on)
Fig. 9 - Maximum Drain Current vs. Case Temperature
td(off) tf
tr
Fig. 10b - Switching Time Waveforms
Thermal Response (Z thJC )
10
1
D = 0.50
0.20
0.10
0.1
0.05
PDM
0.02
0.01
SINGLE PULSE
(THERMAL RESPONSE)
0.01
t1
t2
Notes:
1. Duty factor D = t 1 / t 2
2. Peak T J = P DM x Z thJC + TC
0.001
0.00001
0.0001
0.001
0.01
0.1
1
10
t1 , Rectangular Pulse Duration (sec)
Fig. 11 - Maximum Effective Transient Thermal Impedance, Junction-to-Case
VDS
15 V
tp
L
VDS
D.U.T
RG
IAS
20 V
tp
Driver
+
A
- VDD
IAS
0.01 Ω
Fig. 12a - Unclamped Inductive Test Circuit
Document Number: 91051
S-81291-Rev. A, 16-Jun-08
Fig. 12b - Unclamped Inductive Waveforms
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IRF740A, SiHF740A
Vishay Siliconix
TOP
1200
BOTTOM
ID
4.5A
6.3A
10A
1000
800
600
400
580
V DSav , Avalanche Voltage ( V )
EAS , Single Pulse Avalanche Energy (mJ)
1400
560
540
520
500
200
480
1.0
0
25
50
75
100
125
2.0
4.0
5.0
6.0
7.0
8.0
9.0
10.0
IAV , Avalanche Current ( A)
150
Starting TJ , Junction Temperature ( °C)
Fig. 12c - Maximum Avalanche Energy vs. Drain Current
3.0
Fig. 12d - Typical Drain-to-Source Voltage Vs.
Avalanche Current
Current regulator
Same type as D.U.T.
50 kΩ
QG
VGS
12 V
0.2 µF
0.3 µF
QGS
+
QGD
D.U.T.
VG
-
VDS
VGS
3 mA
Charge
IG
ID
Current sampling resistors
Fig. 13a - Basic Gate Charge Waveform
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Fig. 13b - Gate Charge Test Circuit
Document Number: 91051
S-81291-Rev. A, 16-Jun-08
IRF740A, SiHF740A
Vishay Siliconix
Peak Diode Recovery dV/dt Test Circuit
+
D.U.T
Circuit layout considerations
• Low stray inductance
• Ground plane
• Low leakage inductance
current transformer
+
-
-
RG
•
•
•
•
dV/dt controlled by RG
Driver same type as D.U.T.
ISD controlled by duty factor "D"
D.U.T. - device under test
Driver gate drive
P.W.
+
Period
D=
+
-
VDD
P.W.
Period
VGS = 10 V*
D.U.T. ISD waveform
Reverse
recovery
current
Body diode forward
current
dI/dt
D.U.T. VDS waveform
Diode recovery
dV/dt
Re-applied
voltage
VDD
Body diode forward drop
Inductor current
Ripple ≤ 5 %
ISD
* VGS = 5 V for logic level devices
Fig. 14 - For N-Channel
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see http://www.vishay.com/ppg?91051.
Document Number: 91051
S-81291-Rev. A, 16-Jun-08
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Vishay
Disclaimer
All product specifications and data are subject to change without notice.
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(collectively, “Vishay”), disclaim any and all liability for any errors, inaccuracies or incompleteness contained herein
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Document Number: 91000
Revision: 18-Jul-08
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